Presentation 2017-12-15
Weighted Fault Coverage Considering Via Open Faults
Taiki Kobayashi, Kazuhiko Iwasaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Methods to reduce defect level for VLSI chips have been developed, which is based on weighted fault coverage using critical area . In this manuscript, not only bridge and open faults but also via open faults are considered to calculate the weighted fault coverage. First, a test pattern set that can detect via open faults is selected from those for bridge faults. Next, a set of test pattern are compressed that can detect the remaining faults. The results show the proposed technique reduce the size of the test pattern set by about 20% compared to that for bridge faults generated by an ATPG tool.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Critical area / Weighted fault coverage / Via open fault / Bridge fault / Open fault
Paper # DC2017-74
Date of Issue 2017-12-08 (DC)

Conference Information
Committee DC
Conference Date 2017/12/15(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Akita Study Center, The Open University of Japan
Topics (in Japanese) (See Japanese page)
Topics (in English) Winter Workshop on safety
Chair Michiko Inoue(NAIST)
Vice Chair Satoshi Fukumoto(Tokyo Metropolitan Univ.)
Secretary Satoshi Fukumoto(Kyoto Sangyo Univ.)
Assistant Masayuki Arai(Nihon Univ.)

Paper Information
Registration To Technical Committee on Dependable Computing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Weighted Fault Coverage Considering Via Open Faults
Sub Title (in English)
Keyword(1) Critical area
Keyword(2) Weighted fault coverage
Keyword(3) Via open fault
Keyword(4) Bridge fault
Keyword(5) Open fault
1st Author's Name Taiki Kobayashi
1st Author's Affiliation Tokyo Metropolitan University(TMU)
2nd Author's Name Kazuhiko Iwasaki
2nd Author's Affiliation Tokyo Metropolitan University(TMU)
Date 2017-12-15
Paper # DC2017-74
Volume (vol) vol.117
Number (no) DC-359
Page pp.pp.31-36(DC),
#Pages 6
Date of Issue 2017-12-08 (DC)