Presentation | 2017-12-15 Weighted Fault Coverage Considering Via Open Faults Taiki Kobayashi, Kazuhiko Iwasaki, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Methods to reduce defect level for VLSI chips have been developed, which is based on weighted fault coverage using critical area . In this manuscript, not only bridge and open faults but also via open faults are considered to calculate the weighted fault coverage. First, a test pattern set that can detect via open faults is selected from those for bridge faults. Next, a set of test pattern are compressed that can detect the remaining faults. The results show the proposed technique reduce the size of the test pattern set by about 20% compared to that for bridge faults generated by an ATPG tool. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Critical area / Weighted fault coverage / Via open fault / Bridge fault / Open fault |
Paper # | DC2017-74 |
Date of Issue | 2017-12-08 (DC) |
Conference Information | |
Committee | DC |
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Conference Date | 2017/12/15(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Akita Study Center, The Open University of Japan |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Winter Workshop on safety |
Chair | Michiko Inoue(NAIST) |
Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
Assistant | Masayuki Arai(Nihon Univ.) |
Paper Information | |
Registration To | Technical Committee on Dependable Computing |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Weighted Fault Coverage Considering Via Open Faults |
Sub Title (in English) | |
Keyword(1) | Critical area |
Keyword(2) | Weighted fault coverage |
Keyword(3) | Via open fault |
Keyword(4) | Bridge fault |
Keyword(5) | Open fault |
1st Author's Name | Taiki Kobayashi |
1st Author's Affiliation | Tokyo Metropolitan University(TMU) |
2nd Author's Name | Kazuhiko Iwasaki |
2nd Author's Affiliation | Tokyo Metropolitan University(TMU) |
Date | 2017-12-15 |
Paper # | DC2017-74 |
Volume (vol) | vol.117 |
Number (no) | DC-359 |
Page | pp.pp.31-36(DC), |
#Pages | 6 |
Date of Issue | 2017-12-08 (DC) |