Presentation 2017-11-30
Detailed analysis of S-shaped temperature dependence of photoluminescence peak energy in InGaN quantum wells
Yuma Ikeda, Shigeta Sakai, Itsuki Oshima, Atsushi A. Yamaguchi, Yuya Kanitani, Shigetaka Tomiya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Analysis of S-shaped temperature dependence of PL peak energy is widely used to evaluate the degree of compositional fluctuation in InGaN alloy materials used as active layers in LEDs and laser diodes. However, the fitting function commonly used in this analysis is derived on the basis of some bold approximation, and the analysis can be applied in only limited conditions (e.g. high temperature and small carrier density). In this work, we have established a new theoretical model which can be applied in wide ranges of temperature and carrier density. A measured S-shape behavior in an InGaN quantum-well structure has been analyzed by the theoretical model, and it is shown that the S-shaped behavior can be well fitted by our model in a wide temperature range, compared with the conventional model.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InGaN-QWs / compositional fluctuation / S-Shape
Paper # ED2017-51,CPM2017-94,LQE2017-64
Date of Issue 2017-11-23 (ED, CPM, LQE)

Conference Information
Committee LQE / CPM / ED
Conference Date 2017/11/30(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Nagoya Inst. tech.
Topics (in Japanese) (See Japanese page)
Topics (in English) Nitride Semiconductor Devices, Materials, Related Technologies
Chair Tsuyoshi Yamamoto(Fujitsu Labs.) / Fumihiko Hirose(Yamagata Univ.) / Kunio Tsuda(Toshiba)
Vice Chair Kiichi Hamamoto(Kyusyu Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Michihiko Suhara(TMU)
Secretary Kiichi Hamamoto(Tohoku Univ.) / Mayumi Takeyama(SEI) / Michihiko Suhara(Nihon Univ.)
Assistant Yasumasa Kawakita(Furukawa Electric Industries) / Naoki Fujiwara(NTT) / Yuichi Akage(NTT) / Toshiyuki Oishi(Saga Univ.) / Tatsuya Iwata(TUT)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Detailed analysis of S-shaped temperature dependence of photoluminescence peak energy in InGaN quantum wells
Sub Title (in English)
Keyword(1) InGaN-QWs
Keyword(2) compositional fluctuation
Keyword(3) S-Shape
1st Author's Name Yuma Ikeda
1st Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tehc.)
2nd Author's Name Shigeta Sakai
2nd Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tehc.)
3rd Author's Name Itsuki Oshima
3rd Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tehc.)
4th Author's Name Atsushi A. Yamaguchi
4th Author's Affiliation Kanazawa Institute of Technology(Kanazawa Inst. of Tehc.)
5th Author's Name Yuya Kanitani
5th Author's Affiliation Sony Corporation(Sony)
6th Author's Name Shigetaka Tomiya
6th Author's Affiliation Sony Corporation(Sony)
Date 2017-11-30
Paper # ED2017-51,CPM2017-94,LQE2017-64
Volume (vol) vol.117
Number (no) ED-331,CPM-332,LQE-333
Page pp.pp.11-14(ED), pp.11-14(CPM), pp.11-14(LQE),
#Pages 4
Date of Issue 2017-11-23 (ED, CPM, LQE)