Presentation 2017-11-22
A study on dynamic characteristic measurement method for power electronics circuit applying wide band gap semiconductor device
Kei Hayashi, Tsuyoshi Funaki, Takaaki Ibuchi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EMCJ2017-72
Date of Issue 2017-11-15 (EMCJ)

Conference Information
Committee EMCJ
Conference Date 2017/11/22(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) Young Scientist Meeting
Chair Osami Wada(Kyoto Univ.)
Vice Chair Kensei Oh(Nagoya Inst. of Tech.)
Secretary Kensei Oh(AIST)
Assistant Shinichiro Yamamoto(Univ. of Hyogo) / Chie Sasaki(Panasonic) / Shinobu Nagasawa(Mitsubishi Electric)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A study on dynamic characteristic measurement method for power electronics circuit applying wide band gap semiconductor device
Sub Title (in English)
Keyword(1)
1st Author's Name Kei Hayashi
1st Author's Affiliation Osaka University(Osaka Univ.)
2nd Author's Name Tsuyoshi Funaki
2nd Author's Affiliation Osaka University(Osaka Univ.)
3rd Author's Name Takaaki Ibuchi
3rd Author's Affiliation Osaka University(Osaka Univ.)
Date 2017-11-22
Paper # EMCJ2017-72
Volume (vol) vol.117
Number (no) EMCJ-319
Page pp.pp.45-50(EMCJ),
#Pages 6
Date of Issue 2017-11-15 (EMCJ)