Presentation | 2017-11-22 A study on dynamic characteristic measurement method for power electronics circuit applying wide band gap semiconductor device Kei Hayashi, Tsuyoshi Funaki, Takaaki Ibuchi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EMCJ2017-72 |
Date of Issue | 2017-11-15 (EMCJ) |
Conference Information | |
Committee | EMCJ |
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Conference Date | 2017/11/22(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Young Scientist Meeting |
Chair | Osami Wada(Kyoto Univ.) |
Vice Chair | Kensei Oh(Nagoya Inst. of Tech.) |
Secretary | Kensei Oh(AIST) |
Assistant | Shinichiro Yamamoto(Univ. of Hyogo) / Chie Sasaki(Panasonic) / Shinobu Nagasawa(Mitsubishi Electric) |
Paper Information | |
Registration To | Technical Committee on Electromagnetic Compatibility |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A study on dynamic characteristic measurement method for power electronics circuit applying wide band gap semiconductor device |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Kei Hayashi |
1st Author's Affiliation | Osaka University(Osaka Univ.) |
2nd Author's Name | Tsuyoshi Funaki |
2nd Author's Affiliation | Osaka University(Osaka Univ.) |
3rd Author's Name | Takaaki Ibuchi |
3rd Author's Affiliation | Osaka University(Osaka Univ.) |
Date | 2017-11-22 |
Paper # | EMCJ2017-72 |
Volume (vol) | vol.117 |
Number (no) | EMCJ-319 |
Page | pp.pp.45-50(EMCJ), |
#Pages | 6 |
Date of Issue | 2017-11-15 (EMCJ) |