Presentation 2017-11-16
A Study for Accelerated Humidity Stress Test
Sadanori Ito,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress reliability test is significant. However, the mechanism of humidity stress is so various that the evaluation method may not be suitable to cover all cases. Especially, high temperature and high humidity test tend to be regarded as the acceleration test, this assumption leads to the wrong example. Here, the humidity acceleration is considered involved the electro chemical migration test.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Absolute water vapor pressure model / Relative humidity model / Temperature-Humidity Cycle test
Paper # R2017-50
Date of Issue 2017-11-09 (R)

Conference Information
Committee R
Conference Date 2017/11/16(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Tetsushi Yuge(National Defense Academy)
Vice Chair Akira Asato(Fujitsu)
Secretary Akira Asato(Hosei Univ.)
Assistant Shinji Inoue(Kansai Univ.) / Hiroyuki Okamura(Hiroshima Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study for Accelerated Humidity Stress Test
Sub Title (in English)
Keyword(1) Absolute water vapor pressure model
Keyword(2) Relative humidity model
Keyword(3) Temperature-Humidity Cycle test
1st Author's Name Sadanori Ito
1st Author's Affiliation Itoken Office(Itoken)
Date 2017-11-16
Paper # R2017-50
Volume (vol) vol.117
Number (no) R-302
Page pp.pp.1-4(R),
#Pages 4
Date of Issue 2017-11-09 (R)