Presentation | 2017-11-16 A Study for Accelerated Humidity Stress Test Sadanori Ito, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress reliability test is significant. However, the mechanism of humidity stress is so various that the evaluation method may not be suitable to cover all cases. Especially, high temperature and high humidity test tend to be regarded as the acceleration test, this assumption leads to the wrong example. Here, the humidity acceleration is considered involved the electro chemical migration test. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Absolute water vapor pressure model / Relative humidity model / Temperature-Humidity Cycle test |
Paper # | R2017-50 |
Date of Issue | 2017-11-09 (R) |
Conference Information | |
Committee | R |
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Conference Date | 2017/11/16(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Tetsushi Yuge(National Defense Academy) |
Vice Chair | Akira Asato(Fujitsu) |
Secretary | Akira Asato(Hosei Univ.) |
Assistant | Shinji Inoue(Kansai Univ.) / Hiroyuki Okamura(Hiroshima Univ.) |
Paper Information | |
Registration To | Technical Committee on Reliability |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study for Accelerated Humidity Stress Test |
Sub Title (in English) | |
Keyword(1) | Absolute water vapor pressure model |
Keyword(2) | Relative humidity model |
Keyword(3) | Temperature-Humidity Cycle test |
1st Author's Name | Sadanori Ito |
1st Author's Affiliation | Itoken Office(Itoken) |
Date | 2017-11-16 |
Paper # | R2017-50 |
Volume (vol) | vol.117 |
Number (no) | R-302 |
Page | pp.pp.1-4(R), |
#Pages | 4 |
Date of Issue | 2017-11-09 (R) |