| Presentation | 2017-11-30 A novel method to measure absolute internal quantum efficiency in InGaN quantum wells by simultaneous photo-acoustic and photoluminescence spectroscopy Naoto Shimizu, Yuchi Takahashi, Genki Kobayashi, Takashi Nakano, Shigeta Sakai, Atsusi A. Yamaguchi, Yuya Kanitani, Shigetaka Tomiya, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ED2017-49,CPM2017-92,LQE2017-62 |
| Date of Issue | 2017-11-23 (ED, CPM, LQE) |
| Conference Information | |
| Committee | LQE / CPM / ED |
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| Conference Date | 2017/11/30(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Nagoya Inst. tech. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Nitride Semiconductor Devices, Materials, Related Technologies |
| Chair | Tsuyoshi Yamamoto(Fujitsu Labs.) / Fumihiko Hirose(Yamagata Univ.) / Kunio Tsuda(Toshiba) |
| Vice Chair | Kiichi Hamamoto(Kyusyu Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Michihiko Suhara(TMU) |
| Secretary | Kiichi Hamamoto(Tohoku Univ.) / Mayumi Takeyama(SEI) / Michihiko Suhara(Nihon Univ.) |
| Assistant | Yasumasa Kawakita(Furukawa Electric Industries) / Naoki Fujiwara(NTT) / Yuichi Akage(NTT) / Toshiyuki Oishi(Saga Univ.) / Tatsuya Iwata(TUT) |
| Paper Information | |
| Registration To | Technical Committee on Lasers and Quantum Electronics / Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A novel method to measure absolute internal quantum efficiency in InGaN quantum wells by simultaneous photo-acoustic and photoluminescence spectroscopy |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Naoto Shimizu |
| 1st Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 2nd Author's Name | Yuchi Takahashi |
| 2nd Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 3rd Author's Name | Genki Kobayashi |
| 3rd Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 4th Author's Name | Takashi Nakano |
| 4th Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 5th Author's Name | Shigeta Sakai |
| 5th Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 6th Author's Name | Atsusi A. Yamaguchi |
| 6th Author's Affiliation | Kanazawa Institute of Technology(Kanazawa Inst. of Tech.) |
| 7th Author's Name | Yuya Kanitani |
| 7th Author's Affiliation | Sony Corporation(Sony) |
| 8th Author's Name | Shigetaka Tomiya |
| 8th Author's Affiliation | Sony Corporation(Sony) |
| Date | 2017-11-30 |
| Paper # | ED2017-49,CPM2017-92,LQE2017-62 |
| Volume (vol) | vol.117 |
| Number (no) | ED-331,CPM-332,LQE-333 |
| Page | pp.pp.1-6(ED), pp.1-6(CPM), pp.1-6(LQE), |
| #Pages | 6 |
| Date of Issue | 2017-11-23 (ED, CPM, LQE) |