Presentation | 2017-11-07 Design to Improve Open Defect Detection for Test Based on IDDT Appearance Time Ayumu Kambara, Kouhei Ohtani, Hiroyuki Yotsuyanagi, Masaki Hashizume, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Increasing open defects has become a problem. We proposed a supply current test method with a built-in sensor for detecting open defects on signal lines in CMOS logic circuits. The test method is based on an appearance time of dynamic supply current that flows when a test input vector is provided to a device under test. We propose the improved test method to make the difference of IDDT appearance time greater. In addition, SPICE simulation results show that open defects are detected by the improved sensor. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | supply current / IDDT testing / open defect / built-in current sensor |
Paper # | VLD2017-49,DC2017-55 |
Date of Issue | 2017-10-30 (VLD, DC) |
Conference Information | |
Committee | VLD / DC / CPSY / RECONF / CPM / ICD / IE / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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Conference Date | 2017/11/6(3days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kumamoto-Kenminkouryukan Parea |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Design Gaia 2017 -New Field of VLSI Design- |
Chair | Hiroyuki Ochi(Ritsumeikan Univ.) / Michiko Inoue(NAIST) / Koji Nakano(Hiroshima Univ.) / Masato Motomura(Hokkaido Univ.) / Fumihiko Hirose(Yamagata Univ.) / Hideto Hidaka(Renesas) / Takayuki Hamamoto(Tokyo Univ. of Science) / Kiyoharu Hamaguchi(Shimane Univ.) / 渡辺 晴美(東海大) / Masahiro Goshima(NII) |
Vice Chair | Noriyuki Minegishi(Mitsubishi Electric) / Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Takashi Miyoshi(Fujitsu) / Yuichiro Shibata(Nagasaki Univ.) / Kentaro Sano(Tohoku Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Makoto Nagata(Kobe Univ.) / Kazuya Kodama(NII) / Hideaki Kimata(NTT) |
Secretary | Noriyuki Minegishi(Hiroshima City Univ.) / Satoshi Fukumoto(NTT) / Hidetsugu Irie(Kyoto Sangyo Univ.) / Takashi Miyoshi(Tokyo Inst. of Tech.) / Yuichiro Shibata(Utsunomiya Univ.) / Kentaro Sano(Hokkaido Univ.) / Mayumi Takeyama(Hiroshima City Univ.) / Makoto Nagata(e-trees.Japan) / Kazuya Kodama(Nihon Univ.) / Hideaki Kimata(Toyohashi Univ. of Tech.) / (Univ. of Tokyo) / (Panasonic) / (Nagoya Univ.) |
Assistant | / Masayuki Arai(Nihon Univ.) / Yasuaki Ito(Hiroshima Univ.) / Tomoaki Tsumura(Nagoya Inst. of Tech.) / Yuuki Kobayashi(NEC) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Yuichi Akage(NTT) / Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Yasutaka Matsuo(NHK) / Kazuya Hayase(NTT) |
Paper Information | |
Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Component Parts and Materials / Technical Committee on Integrated Circuits and Devices / Technical Committee on Image Engineering / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Design to Improve Open Defect Detection for Test Based on IDDT Appearance Time |
Sub Title (in English) | |
Keyword(1) | supply current |
Keyword(2) | IDDT testing |
Keyword(3) | open defect |
Keyword(4) | built-in current sensor |
1st Author's Name | Ayumu Kambara |
1st Author's Affiliation | Tokushima University(Tokushima Univ.) |
2nd Author's Name | Kouhei Ohtani |
2nd Author's Affiliation | Tokushima University(Tokushima Univ.) |
3rd Author's Name | Hiroyuki Yotsuyanagi |
3rd Author's Affiliation | Tokushima University(Tokushima Univ.) |
4th Author's Name | Masaki Hashizume |
4th Author's Affiliation | Tokushima University(Tokushima Univ.) |
Date | 2017-11-07 |
Paper # | VLD2017-49,DC2017-55 |
Volume (vol) | vol.117 |
Number (no) | VLD-273,DC-274 |
Page | pp.pp.125-130(VLD), pp.125-130(DC), |
#Pages | 6 |
Date of Issue | 2017-10-30 (VLD, DC) |