Presentation 2017-11-17
Hole mobility measurement in organic semiconductor thin films by MIS-CELIV method
Chiho Katagiri, Ken-ichi Nakayama,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The MIS-CELIV method is expected as a novel technique for measuring electron and hole mobilities in thin organic films. The charge carrier mobility is estimated from current transients due to extraction of accumulated charges at the insulator/semiconductor interface by applying a large external forward bias. In this study, the hole mobility of a p-type organic semiconductors was estimated using the MIS-CLEIV method. Toward establishing this method as a measurement method for unipolar carrier mobility, we investigated reliability of the MIS-CELIV mobility and applicability to various kinds of material.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MIS-CELIV / Hole mobility / p-type organic semiconductors
Paper # OME2017-28
Date of Issue 2017-11-10 (OME)

Conference Information
Committee OME
Conference Date 2017/11/17(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Osaka Univ. Nakanoshima Center
Topics (in Japanese) (See Japanese page)
Topics (in English) Organic devices and sensors, etc.
Chair Tatsuo Mori(Aichi Inst. of Tech.)
Vice Chair Yutaka Majima(Tokyo Inst. of Tech.)
Secretary Yutaka Majima(NICT)
Assistant Hirotake Kajii(Osaka Univ.) / Toshihiko Kaji(Tokyo Univ. of Agriculture and Tech.)

Paper Information
Registration To Technical Committee on Organic Molecular Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Hole mobility measurement in organic semiconductor thin films by MIS-CELIV method
Sub Title (in English)
Keyword(1) MIS-CELIV
Keyword(2) Hole mobility
Keyword(3) p-type organic semiconductors
1st Author's Name Chiho Katagiri
1st Author's Affiliation Yamagata University/Osaka University(Yamagata Univ./Osaka Univ.)
2nd Author's Name Ken-ichi Nakayama
2nd Author's Affiliation Osaka University/Yamagata University(Osaka Univ./Yamagata Univ.)
Date 2017-11-17
Paper # OME2017-28
Volume (vol) vol.117
Number (no) OME-313
Page pp.pp.7-10(OME),
#Pages 4
Date of Issue 2017-11-10 (OME)