| Presentation | 2017-10-26 [Invited Lecture] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is developed for hardware security applications. In this paper, we investigate wide range tolerance on applied voltage, temperature and aging influence for basic PUF characteristics utilizing SG-MONOS initial Vt variation. High-temperature stable PUF at the junction temperature (Tj) of 170oC can be confirmed by applying widely used automotive quality SG-MONOS flash memory. In addition, newly implemented offset read scheme achieves 0% error rate for PUF reliability without ECC. |
| Keyword(in Japanese) | (See Japanese page) |
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| Paper # | SDM2017-58 |
| Date of Issue | 2017-10-18 (SDM) |
| Conference Information | |
| Committee | SDM |
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| Conference Date | 2017/10/25(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Niche, Tohoku Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process Science and New Process Technology |
| Chair | Tatsuya Kunikiyo(Renesas) |
| Vice Chair | Takahiro Shinada(Tohoku Univ.) |
| Secretary | Takahiro Shinada(Tohoku Univ.) |
| Assistant | Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) |
| Paper Information | |
| Registration To | Technical Committee on Silicon Device and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications |
| Sub Title (in English) | |
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| 1st Author's Name | Takahiro Shimoi |
| 1st Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 2nd Author's Name | Tomoya Saito |
| 2nd Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 3rd Author's Name | Hirokazu Nagase |
| 3rd Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 4th Author's Name | Masayuki Izuna |
| 4th Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 5th Author's Name | Akihiko Kanda |
| 5th Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 6th Author's Name | Takashi Ito |
| 6th Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| 7th Author's Name | Takashi Kono |
| 7th Author's Affiliation | Renesas Electronics Corporation(Renesas Electronics) |
| Date | 2017-10-26 |
| Paper # | SDM2017-58 |
| Volume (vol) | vol.117 |
| Number (no) | SDM-260 |
| Page | pp.pp.45-49(SDM), |
| #Pages | 5 |
| Date of Issue | 2017-10-18 (SDM) |