| Presentation | 2017-08-31 Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range Masahiro Ueno, Takashi Sakamoto, Seiji Toyoda, Yuzo Sasaki, Joji Yamaguchi, Tadashi Sakamoto, Masatoshi Fujimoto, Mahiro Yamada, Eiichi Sugai, Toru Kodaira, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Swept source optical coherence tomography (SS-OCT) is a technique to capture tomographic images of moving objects at high speed with high resolution of several 10 µm level. In thickness measurement using SS-OCT technique, the light reflected when the swept light is irradiated to the observation target is used. If the central wavelength of the sweep range fluctuates due to some influence, the optical path length within the observation target fluctuates due to the refractive index chromatic dispersion of the target. Therefore, the fluctuation of the center wavelength affects the thickness measurement value. In this paper, we describe that fluctuation of thickness measurement value can be suppressed by performing signal processing adapted to wavelength fluctuation using the dispersion characteristics. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Wavelength-dispersive refractive index / SS-OCT / Rescaling / Resampling / PSF |
| Paper # | R2017-26,EMD2017-20,CPM2017-41,OPE2017-50,LQE2017-23 |
| Date of Issue | 2017-08-24 (R, EMD, CPM, OPE, LQE) |
| Conference Information | |
| Committee | R / EMD / CPM / LQE / OPE |
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| Conference Date | 2017/8/31(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Tetsushi Yuge(National Defense Academy) / Yoshiteru Abe(NTT-AT) / Fumihiko Hirose(Yamagata Univ.) / Tsuyoshi Yamamoto(Fujitsu Labs.) / Kazutoshi Kato(Kyushu Univ.) |
| Vice Chair | Akira Asato(Fujitsu) / / Mayumi Takeyama(Kitami Inst. of Tech.) / Kiichi Hamamoto(Kyusyu Univ.) / Kouki Sato(Furukawa Electric Industries) |
| Secretary | Akira Asato(Hosei Univ.) / (RTRI) / Mayumi Takeyama(Tohoku Gakuin Univ.) / Kiichi Hamamoto(Muroran Inst. of Tech.) / Kouki Sato(Nihon Univ.) |
| Assistant | Shinji Inoue(Kansai Univ.) / Hiroyuki Okamura(Hiroshima Univ.) / Yoshiki Kayano(Univ. of Electro-Comm.) / Yuichi Akage(NTT) / Yasumasa Kawakita(Furukawa Electric Industries) / Naoki Fujiwara(NTT) / Takuo Tanemura(Univ. of Tokyo) |
| Paper Information | |
| Registration To | Technical Committee on Reliability / Technical Committee on Electromechanical Devices / Technical Committee on Component Parts and Materials / Technical Committee on Lasers and Quantum Electronics / Technical Committee on OptoElectronics |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range |
| Sub Title (in English) | |
| Keyword(1) | Wavelength-dispersive refractive index |
| Keyword(2) | SS-OCT |
| Keyword(3) | Rescaling |
| Keyword(4) | Resampling |
| Keyword(5) | PSF |
| 1st Author's Name | Masahiro Ueno |
| 1st Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 2nd Author's Name | Takashi Sakamoto |
| 2nd Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 3rd Author's Name | Seiji Toyoda |
| 3rd Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 4th Author's Name | Yuzo Sasaki |
| 4th Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 5th Author's Name | Joji Yamaguchi |
| 5th Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 6th Author's Name | Tadashi Sakamoto |
| 6th Author's Affiliation | Nippon Telegraph and Telephone Corporation(NTT) |
| 7th Author's Name | Masatoshi Fujimoto |
| 7th Author's Affiliation | Hamamatsu Photonics K. K.(Hamamatsu Photonics K. K.) |
| 8th Author's Name | Mahiro Yamada |
| 8th Author's Affiliation | Hamamatsu Photonics K. K.(Hamamatsu Photonics K. K.) |
| 9th Author's Name | Eiichi Sugai |
| 9th Author's Affiliation | NTT Advanced Technology Corporation(NTT-AT) |
| 10th Author's Name | Toru Kodaira |
| 10th Author's Affiliation | NTT Advanced Technology Corporation(NTT-AT) |
| Date | 2017-08-31 |
| Paper # | R2017-26,EMD2017-20,CPM2017-41,OPE2017-50,LQE2017-23 |
| Volume (vol) | vol.117 |
| Number (no) | R-191,EMD-192,CPM-193,OPE-194,LQE-195 |
| Page | pp.pp.11-16(R), pp.11-16(EMD), pp.11-16(CPM), pp.11-16(OPE), pp.11-16(LQE), |
| #Pages | 6 |
| Date of Issue | 2017-08-24 (R, EMD, CPM, OPE, LQE) |