Presentation 2017-08-02
[Invited Talk] SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction
Toshimasa Matsuoka, Takatsugu Kamata, Masayuki Ueda, Yusaku Hirai, Sadahiro Tani, Tomohiro Asano, Shodai Isami, Toshifumi Kurata, Keiji Tatsumi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) To realize daily life health care and telemedicine utilizing ICT infrastructure of the mobile cloud environment, wearable biomedical information sensing devices and ICT techniques are required to be popularized. Overlooking the whole system, we are developing low-power high-precision analog front-end (AFE) IC embedding machine-learning error correction function, which uses a successive-approximation-register A/D converter with stochastic A/D conversion as a promising circuit technique. This paper describes design and evaluation results of the proto-type AFE IC.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SAR-ADC / DAC error calibration / stochastic A/D conversion / mismatch / machine learning
Paper # SDM2017-42,ICD2017-30
Date of Issue 2017-07-24 (SDM, ICD)

Conference Information
Committee SDM / ICD / ITE-IST
Conference Date 2017/7/31(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Hokkaido-Univ. Multimedia Education Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications
Chair Tatsuya Kunikiyo(Renesas) / Hideto Hidaka(Renesas) / Shigetoshi Sugawa(Tohoku Univ.)
Vice Chair Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Kobe Univ.) / Takayuki Hamamoto(Tokyo University of Science) / Hiroshi Ohtake(NHK)
Secretary Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Renesas) / Takayuki Hamamoto(Univ. of Tokyo) / Hiroshi Ohtake(Panasonic)
Assistant Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) / Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials / Technical Committee on Integrated Circuits and Devices / Technical Group on Information Sensing Technologies
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction
Sub Title (in English)
Keyword(1) SAR-ADC
Keyword(2) DAC error calibration
Keyword(3) stochastic A/D conversion
Keyword(4) mismatch
Keyword(5) machine learning
1st Author's Name Toshimasa Matsuoka
1st Author's Affiliation Osaka University(Osaka Univ.)
2nd Author's Name Takatsugu Kamata
2nd Author's Affiliation SPChange(SPChange)
3rd Author's Name Masayuki Ueda
3rd Author's Affiliation SPChange(SPChange)
4th Author's Name Yusaku Hirai
4th Author's Affiliation Osaka University(Osaka Univ.)
5th Author's Name Sadahiro Tani
5th Author's Affiliation Osaka University(Osaka Univ.)
6th Author's Name Tomohiro Asano
6th Author's Affiliation Osaka University(Osaka Univ.)
7th Author's Name Shodai Isami
7th Author's Affiliation Osaka University(Osaka Univ.)
8th Author's Name Toshifumi Kurata
8th Author's Affiliation Osaka University(Osaka Univ.)
9th Author's Name Keiji Tatsumi
9th Author's Affiliation Osaka University(Osaka Univ.)
Date 2017-08-02
Paper # SDM2017-42,ICD2017-30
Volume (vol) vol.117
Number (no) SDM-166,ICD-167
Page pp.pp.95-100(SDM), pp.95-100(ICD),
#Pages 6
Date of Issue 2017-07-24 (SDM, ICD)