Presentation | 2017-08-02 [Invited Talk] SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction Toshimasa Matsuoka, Takatsugu Kamata, Masayuki Ueda, Yusaku Hirai, Sadahiro Tani, Tomohiro Asano, Shodai Isami, Toshifumi Kurata, Keiji Tatsumi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | To realize daily life health care and telemedicine utilizing ICT infrastructure of the mobile cloud environment, wearable biomedical information sensing devices and ICT techniques are required to be popularized. Overlooking the whole system, we are developing low-power high-precision analog front-end (AFE) IC embedding machine-learning error correction function, which uses a successive-approximation-register A/D converter with stochastic A/D conversion as a promising circuit technique. This paper describes design and evaluation results of the proto-type AFE IC. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SAR-ADC / DAC error calibration / stochastic A/D conversion / mismatch / machine learning |
Paper # | SDM2017-42,ICD2017-30 |
Date of Issue | 2017-07-24 (SDM, ICD) |
Conference Information | |
Committee | SDM / ICD / ITE-IST |
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Conference Date | 2017/7/31(3days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Hokkaido-Univ. Multimedia Education Bldg. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications |
Chair | Tatsuya Kunikiyo(Renesas) / Hideto Hidaka(Renesas) / Shigetoshi Sugawa(Tohoku Univ.) |
Vice Chair | Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Kobe Univ.) / Takayuki Hamamoto(Tokyo University of Science) / Hiroshi Ohtake(NHK) |
Secretary | Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Renesas) / Takayuki Hamamoto(Univ. of Tokyo) / Hiroshi Ohtake(Panasonic) |
Assistant | Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) / Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) |
Paper Information | |
Registration To | Technical Committee on Silicon Device and Materials / Technical Committee on Integrated Circuits and Devices / Technical Group on Information Sensing Technologies |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | [Invited Talk] SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction |
Sub Title (in English) | |
Keyword(1) | SAR-ADC |
Keyword(2) | DAC error calibration |
Keyword(3) | stochastic A/D conversion |
Keyword(4) | mismatch |
Keyword(5) | machine learning |
1st Author's Name | Toshimasa Matsuoka |
1st Author's Affiliation | Osaka University(Osaka Univ.) |
2nd Author's Name | Takatsugu Kamata |
2nd Author's Affiliation | SPChange(SPChange) |
3rd Author's Name | Masayuki Ueda |
3rd Author's Affiliation | SPChange(SPChange) |
4th Author's Name | Yusaku Hirai |
4th Author's Affiliation | Osaka University(Osaka Univ.) |
5th Author's Name | Sadahiro Tani |
5th Author's Affiliation | Osaka University(Osaka Univ.) |
6th Author's Name | Tomohiro Asano |
6th Author's Affiliation | Osaka University(Osaka Univ.) |
7th Author's Name | Shodai Isami |
7th Author's Affiliation | Osaka University(Osaka Univ.) |
8th Author's Name | Toshifumi Kurata |
8th Author's Affiliation | Osaka University(Osaka Univ.) |
9th Author's Name | Keiji Tatsumi |
9th Author's Affiliation | Osaka University(Osaka Univ.) |
Date | 2017-08-02 |
Paper # | SDM2017-42,ICD2017-30 |
Volume (vol) | vol.117 |
Number (no) | SDM-166,ICD-167 |
Page | pp.pp.95-100(SDM), pp.95-100(ICD), |
#Pages | 6 |
Date of Issue | 2017-07-24 (SDM, ICD) |