Presentation 2017-07-31
TCAD Simulation of C-TFET Circuit with Drain Offset Structure
Hidehiro Asai, Takahiro Mori, Junich Hattori, Koichi Fukuda, Kazuhiko Endo, Takashi Matsukawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have performed TCAD simulation for a ring oscillator composed of complementary Tunnel Field Effect Transistors (C-TFETs), and analyzed the effect of drain-offset structure on the circuit characteristics. The drain-offset structure lowers the OFF current from the drain edge, and this unable us to shrink the gate length of the TFETs. Furthermore, the reduction of gate-drain capacitance (CGD) enhances the oscillation frequency of the ring oscillator. The enhancement effect of frequency by the drain-offset structure is strongly related to the unique dependence of CGD on the drain voltage, and affected by the operation voltage of the ring oscillator.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Tunnel FET / Ring oscillator / Drain offset
Paper # SDM2017-35,ICD2017-23
Date of Issue 2017-07-24 (SDM, ICD)

Conference Information
Committee SDM / ICD / ITE-IST
Conference Date 2017/7/31(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Hokkaido-Univ. Multimedia Education Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications
Chair Tatsuya Kunikiyo(Renesas) / Hideto Hidaka(Renesas) / Shigetoshi Sugawa(Tohoku Univ.)
Vice Chair Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Kobe Univ.) / Takayuki Hamamoto(Tokyo University of Science) / Hiroshi Ohtake(NHK)
Secretary Takahiro Shinada(Tohoku Univ.) / Makoto Nagata(Renesas) / Takayuki Hamamoto(Univ. of Tokyo) / Hiroshi Ohtake(Panasonic)
Assistant Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) / Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials / Technical Committee on Integrated Circuits and Devices / Technical Group on Information Sensing Technologies
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) TCAD Simulation of C-TFET Circuit with Drain Offset Structure
Sub Title (in English)
Keyword(1) Tunnel FET
Keyword(2) Ring oscillator
Keyword(3) Drain offset
1st Author's Name Hidehiro Asai
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
2nd Author's Name Takahiro Mori
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
3rd Author's Name Junich Hattori
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
4th Author's Name Koichi Fukuda
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
5th Author's Name Kazuhiko Endo
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
6th Author's Name Takashi Matsukawa
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
Date 2017-07-31
Paper # SDM2017-35,ICD2017-23
Volume (vol) vol.117
Number (no) SDM-166,ICD-167
Page pp.pp.21-24(SDM), pp.21-24(ICD),
#Pages 4
Date of Issue 2017-07-24 (SDM, ICD)