Presentation | 2017-07-21 Frequency Response Measurement of Third Order Intercept Point of Photo Receiver by Optical Two-tone Method Akihiro Uno, Keizo Inagaki, Tetsuya Kawanishi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The nonlinearity of photo receiver would have large impact on optical communication systems, as they become complicated. This time, we report the result of frequency response measurement of third order intercept point of photo receiver by optical two-tone method which would measure a small nonlinearity of photo receiver with a higher accuracy than the conventional one. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Optical Two-tone Method / Photo Receiver / Third Order Intercept Point / Frequency Response |
Paper # | EMT2017-28,MW2017-53,OPE2017-33,EST2017-30,MWP2017-30 |
Date of Issue | 2017-07-13 (EMT, MW, OPE, EST, MWP) |
Conference Information | |
Committee | MWP / OPE / EMT / MW / EST / IEE-EMT |
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Conference Date | 2017/7/20(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Obihiro Chamber of Commerce and Industry |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Light wave & Electromagnetic Wave Workshop |
Chair | Tetsuya Kawanishi(Waseda Univ.) / Kazutoshi Kato(Kyushu Univ.) / Akira Hirose(Univ. of Tokyo) / Masahiro Muraguchi(TUC) / Hideaki Kimura(NTT) / Keiji Goto(National Defense Academy) |
Vice Chair | Naoto Yoshimoto(Chitose Inst. of Science and Tech.) / Kouki Sato(Furukawa Electric Industries) / Koichi Hirayama(Kitami Inst. of Tech.) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTTdocomo) / Kenichi Tajima(Mitsubishi Electric) / Akimasa Hirata(Nagoya Inst. of Tech.) / Shinichiro Ohnuki(Nihon Univ.) |
Secretary | Naoto Yoshimoto(NICT) / Kouki Sato(Chiba Inst. of Tech.) / Koichi Hirayama(NTT) / Yoshinori Kogami(Kanagawa Inst. of Tech.) / Hiroshi Okazaki(Univ. of Hyogo) / Kenichi Tajima(Tokyo Metro. Coll. of Tech) / Akimasa Hirata(Tokyo Inst. of Tech.) / Shinichiro Ohnuki(HITACHI) / (Tohoku Univ.) |
Assistant | Kosuke Nishimura(KDDI) / Kensuke Ikeda(CRIEPI) / Takuo Tanemura(Univ. of Tokyo) / Tsuyoshi Matsuoka(Kyushu Sangyo Univ.) / Satoshi Ono(Univ. of Electro-Comm.) / Mizuki Motoyoshi(Tohoku Univ.) / Takahiro Ito(Nagoya Inst. of Tech.) / Kazuhiro Fujita(Fujitsu) / Yoshihiro Naka(KUHW) |
Paper Information | |
Registration To | Technical Committee on Microwave and Millimeter-wave Photonics / Technical Committee on OptoElectronics / Technical Committee on Electromagnetic Theory / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology / Technical Meeting on Electromagnetic Theory |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Frequency Response Measurement of Third Order Intercept Point of Photo Receiver by Optical Two-tone Method |
Sub Title (in English) | |
Keyword(1) | Optical Two-tone Method |
Keyword(2) | Photo Receiver |
Keyword(3) | Third Order Intercept Point |
Keyword(4) | Frequency Response |
1st Author's Name | Akihiro Uno |
1st Author's Affiliation | Waseda University(Waseda Univ.) |
2nd Author's Name | Keizo Inagaki |
2nd Author's Affiliation | Waseda University(Waseda Univ.) |
3rd Author's Name | Tetsuya Kawanishi |
3rd Author's Affiliation | Waseda University(Waseda Univ.) |
Date | 2017-07-21 |
Paper # | EMT2017-28,MW2017-53,OPE2017-33,EST2017-30,MWP2017-30 |
Volume (vol) | vol.117 |
Number (no) | EMT-139,MW-140,OPE-141,EST-142,MWP-143 |
Page | pp.pp.117-121(EMT), pp.117-121(MW), pp.117-121(OPE), pp.117-121(EST), pp.117-121(MWP), |
#Pages | 5 |
Date of Issue | 2017-07-13 (EMT, MW, OPE, EST, MWP) |