Presentation 2017-07-21
Frequency Response Measurement of Third Order Intercept Point of Photo Receiver by Optical Two-tone Method
Akihiro Uno, Keizo Inagaki, Tetsuya Kawanishi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The nonlinearity of photo receiver would have large impact on optical communication systems, as they become complicated. This time, we report the result of frequency response measurement of third order intercept point of photo receiver by optical two-tone method which would measure a small nonlinearity of photo receiver with a higher accuracy than the conventional one.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optical Two-tone Method / Photo Receiver / Third Order Intercept Point / Frequency Response
Paper # EMT2017-28,MW2017-53,OPE2017-33,EST2017-30,MWP2017-30
Date of Issue 2017-07-13 (EMT, MW, OPE, EST, MWP)

Conference Information
Committee MWP / OPE / EMT / MW / EST / IEE-EMT
Conference Date 2017/7/20(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Obihiro Chamber of Commerce and Industry
Topics (in Japanese) (See Japanese page)
Topics (in English) Light wave & Electromagnetic Wave Workshop
Chair Tetsuya Kawanishi(Waseda Univ.) / Kazutoshi Kato(Kyushu Univ.) / Akira Hirose(Univ. of Tokyo) / Masahiro Muraguchi(TUC) / Hideaki Kimura(NTT) / Keiji Goto(National Defense Academy)
Vice Chair Naoto Yoshimoto(Chitose Inst. of Science and Tech.) / Kouki Sato(Furukawa Electric Industries) / Koichi Hirayama(Kitami Inst. of Tech.) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTTdocomo) / Kenichi Tajima(Mitsubishi Electric) / Akimasa Hirata(Nagoya Inst. of Tech.) / Shinichiro Ohnuki(Nihon Univ.)
Secretary Naoto Yoshimoto(NICT) / Kouki Sato(Chiba Inst. of Tech.) / Koichi Hirayama(NTT) / Yoshinori Kogami(Kanagawa Inst. of Tech.) / Hiroshi Okazaki(Univ. of Hyogo) / Kenichi Tajima(Tokyo Metro. Coll. of Tech) / Akimasa Hirata(Tokyo Inst. of Tech.) / Shinichiro Ohnuki(HITACHI) / (Tohoku Univ.)
Assistant Kosuke Nishimura(KDDI) / Kensuke Ikeda(CRIEPI) / Takuo Tanemura(Univ. of Tokyo) / Tsuyoshi Matsuoka(Kyushu Sangyo Univ.) / Satoshi Ono(Univ. of Electro-Comm.) / Mizuki Motoyoshi(Tohoku Univ.) / Takahiro Ito(Nagoya Inst. of Tech.) / Kazuhiro Fujita(Fujitsu) / Yoshihiro Naka(KUHW)

Paper Information
Registration To Technical Committee on Microwave and Millimeter-wave Photonics / Technical Committee on OptoElectronics / Technical Committee on Electromagnetic Theory / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology / Technical Meeting on Electromagnetic Theory
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Frequency Response Measurement of Third Order Intercept Point of Photo Receiver by Optical Two-tone Method
Sub Title (in English)
Keyword(1) Optical Two-tone Method
Keyword(2) Photo Receiver
Keyword(3) Third Order Intercept Point
Keyword(4) Frequency Response
1st Author's Name Akihiro Uno
1st Author's Affiliation Waseda University(Waseda Univ.)
2nd Author's Name Keizo Inagaki
2nd Author's Affiliation Waseda University(Waseda Univ.)
3rd Author's Name Tetsuya Kawanishi
3rd Author's Affiliation Waseda University(Waseda Univ.)
Date 2017-07-21
Paper # EMT2017-28,MW2017-53,OPE2017-33,EST2017-30,MWP2017-30
Volume (vol) vol.117
Number (no) EMT-139,MW-140,OPE-141,EST-142,MWP-143
Page pp.pp.117-121(EMT), pp.117-121(MW), pp.117-121(OPE), pp.117-121(EST), pp.117-121(MWP),
#Pages 5
Date of Issue 2017-07-13 (EMT, MW, OPE, EST, MWP)