Presentation 2017-06-20
Formation of Ultrathin Crystalline Structure of Group-IV Elements on Epitaxial Ag(111) Surface
Koichi Ito, Akio Ohta, Masashi Kurosawa, Masaaki Araidai, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Two dimensional (2D) honeycomb crystals such as silicene and germanene are currently receiving much attention because of its exceptional electronic properties. We have studied the growth of such 2D crystals using the segregation of Si (or Ge) on the Ag surface by the annealing of Ag/Si(or SiGe, Ge) structure. An Ag(111) layer was epitaxially grown on Si(111), Ge(111), and SiGe(111) substrate by thermal evaporation, and the chemical and thermal stability of Ag surface were systematically evaluated to get the atomically flat Ag surface. After the annealing of Ag/Ge(111) structure at 450℃ in N2 ambience, segration of Ge atoms with an average thickness of bi-layer on the atomically flat Ag surface were observed from the analyses of AFM and HAXPES measurements.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Two Dimensional Crystal / Group-IV Semiconductor / Atomic Force Microscope / X-ray Photoelectron Spectroscopy
Paper # SDM2017-30
Date of Issue 2017-06-13 (SDM)

Conference Information
Committee SDM
Conference Date 2017/6/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Campus Innovation Center Tokyo
Topics (in Japanese) (See Japanese page)
Topics (in English) Material Science and Process Technology for MOS Devices and Memories
Chair Tatsuya Kunikiyo(Renesas)
Vice Chair Takahiro Shinada(Tohoku Univ.)
Secretary Takahiro Shinada(Tohoku Univ.)
Assistant Hiroya Ikeda(Shizuoka Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Formation of Ultrathin Crystalline Structure of Group-IV Elements on Epitaxial Ag(111) Surface
Sub Title (in English)
Keyword(1) Two Dimensional Crystal
Keyword(2) Group-IV Semiconductor
Keyword(3) Atomic Force Microscope
Keyword(4) X-ray Photoelectron Spectroscopy
1st Author's Name Koichi Ito
1st Author's Affiliation Nagoya University(Nagoya Univ.)
2nd Author's Name Akio Ohta
2nd Author's Affiliation Nagoya University(Nagoya Univ.)
3rd Author's Name Masashi Kurosawa
3rd Author's Affiliation Nagoya University(Nagoya Univ.)
4th Author's Name Masaaki Araidai
4th Author's Affiliation Nagoya University(Nagoya Univ.)
5th Author's Name Mitsuhisa Ikeda
5th Author's Affiliation Nagoya University(Nagoya Univ.)
6th Author's Name Katsunori Makihara
6th Author's Affiliation Nagoya University(Nagoya Univ.)
7th Author's Name Seiichi Miyazaki
7th Author's Affiliation Nagoya University(Nagoya Univ.)
Date 2017-06-20
Paper # SDM2017-30
Volume (vol) vol.117
Number (no) SDM-101
Page pp.pp.43-48(SDM),
#Pages 6
Date of Issue 2017-06-13 (SDM)