Presentation 2017-06-20
Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate
Rumi Takayama, Takuya Hoshii, Akira Nakajima, Shinichi Nishizawa, Hiromichi Ohashi, Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SDM2017-27
Date of Issue 2017-06-13 (SDM)

Conference Information
Committee SDM
Conference Date 2017/6/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Campus Innovation Center Tokyo
Topics (in Japanese) (See Japanese page)
Topics (in English) Material Science and Process Technology for MOS Devices and Memories
Chair Tatsuya Kunikiyo(Renesas)
Vice Chair Takahiro Shinada(Tohoku Univ.)
Secretary Takahiro Shinada(Tohoku Univ.)
Assistant Hiroya Ikeda(Shizuoka Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate
Sub Title (in English)
Keyword(1)
1st Author's Name Rumi Takayama
1st Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
2nd Author's Name Takuya Hoshii
2nd Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
3rd Author's Name Akira Nakajima
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
4th Author's Name Shinichi Nishizawa
4th Author's Affiliation Kyushu University(Kyushu Univ.)
5th Author's Name Hiromichi Ohashi
5th Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
6th Author's Name Kuniyuki Kakushima
6th Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
7th Author's Name Hitoshi Wakabayashi
7th Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
8th Author's Name Kazuo Tsutsui
8th Author's Affiliation Tokyo Institute of Technology(Tokyo Inst. of Tech.)
Date 2017-06-20
Paper # SDM2017-27
Volume (vol) vol.117
Number (no) SDM-101
Page pp.pp.31-34(SDM),
#Pages 4
Date of Issue 2017-06-13 (SDM)