Presentation 2017-06-20
[Invited Lecture] Development of Quantum Imaging Detector using SOI Technology
Yasuo Arai,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Silicon is a good material for detecting quantum beam (Photon, X-ray, Gamma-ray, Electron, Ion, Neutron etc.) and also good for implementing electronics. Then combining these functions in a single chip is sought but it was difficult to realize in standard bulk CMOS technology. We have developed monolithic radiation image sensors using Silicon-On-Insulator (SOI) technology. This enables smaller pixel size than existing detector and in-pixel data processing, thus opened new detection method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SOI / radiation / imaging / X-ray / quantum beam / CMOS / detector
Paper # SDM2017-22
Date of Issue 2017-06-13 (SDM)

Conference Information
Committee SDM
Conference Date 2017/6/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Campus Innovation Center Tokyo
Topics (in Japanese) (See Japanese page)
Topics (in English) Material Science and Process Technology for MOS Devices and Memories
Chair Tatsuya Kunikiyo(Renesas)
Vice Chair Takahiro Shinada(Tohoku Univ.)
Secretary Takahiro Shinada(Tohoku Univ.)
Assistant Hiroya Ikeda(Shizuoka Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Lecture] Development of Quantum Imaging Detector using SOI Technology
Sub Title (in English) Looking Elementary Particles and X-rays with Semiconductor
Keyword(1) SOI
Keyword(2) radiation
Keyword(3) imaging
Keyword(4) X-ray
Keyword(5) quantum beam
Keyword(6) CMOS
Keyword(7) detector
1st Author's Name Yasuo Arai
1st Author's Affiliation High Energy Accelerator Research Organization(KEK)
Date 2017-06-20
Paper # SDM2017-22
Volume (vol) vol.117
Number (no) SDM-101
Page pp.pp.5-8(SDM),
#Pages 4
Date of Issue 2017-06-13 (SDM)