Presentation | 2017-06-22 An Improvement of Robustness for Vertical Transition Using Spring Contact Probes Hiroyuki Aoyama, Hidenori Ishibashi, Naofumi Yoneda, Naoyuki Yamamoto, Moriyasu Miyazaki, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The coaxial connector is commonly used for electrical connection between circuit boards at radio frequency (RF). However, it is necessary to match position of coaxial pins for the connection, so circuit boards cannot be connected when the connectors are misaligned. For realizing a misalignment-resistant RF connection structure, we have studied the RF connection structure using spring contact probes. In this paper, RF connector with improved robustness by defected ground structure (DGS) is proposed. In addition, efficiency of proposed structure is verified by electromagnetic simulation and measure. The measurement results of fabricated connector shows that conventional structure with a gap between substrate and metal chassis has 17dB return loss. On the other hand, proposed structure has 20dB return loss, and we confirm the efficiency of it. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | RF connection / Spring contact probe / Transition / DGS |
Paper # | MW2017-21 |
Date of Issue | 2017-06-15 (MW) |
Conference Information | |
Committee | MW |
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Conference Date | 2017/6/22(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | A-101, Wing-A, Toyohashi University of Technology |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Microwave Signal Generation and Measurement / Microwave Technologies |
Chair | Masahiro Muraguchi(TUC) |
Vice Chair | Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTTdocomo) / Kenichi Tajima(Mitsubishi Electric) |
Secretary | Yoshinori Kogami(Tokyo Inst. of Tech.) / Hiroshi Okazaki(HITACHI) / Kenichi Tajima |
Assistant | Satoshi Ono(Univ. of Electro-Comm.) / Mizuki Motoyoshi(Tohoku Univ.) |
Paper Information | |
Registration To | Technical Committee on Microwaves |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Improvement of Robustness for Vertical Transition Using Spring Contact Probes |
Sub Title (in English) | |
Keyword(1) | RF connection |
Keyword(2) | Spring contact probe |
Keyword(3) | Transition |
Keyword(4) | DGS |
1st Author's Name | Hiroyuki Aoyama |
1st Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric Corp.) |
2nd Author's Name | Hidenori Ishibashi |
2nd Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric Corp.) |
3rd Author's Name | Naofumi Yoneda |
3rd Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric Corp.) |
4th Author's Name | Naoyuki Yamamoto |
4th Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric Corp.) |
5th Author's Name | Moriyasu Miyazaki |
5th Author's Affiliation | Mitsubishi Electric Corporation(Mitsubishi Electric Corp.) |
Date | 2017-06-22 |
Paper # | MW2017-21 |
Volume (vol) | vol.117 |
Number (no) | MW-104 |
Page | pp.pp.1-4(MW), |
#Pages | 4 |
Date of Issue | 2017-06-15 (MW) |