| Presentation | 2017-04-21 Design and high speed test of an SFQ complex event detector circuit for complex event processing Ryosuke Sato, Tomohiro ono, Yuki Yamanashi, Nobuyuki Yoshikawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We study about complex event detector (CED) circuits and symbol matching circuits, which are component circuits of the CED circuits, based on single-flux-quantum (SFQ) circuit technology. The CED circuits are fundamental processing units in complex event processing (CEP) systems. Pattern matching of input data with “symbols,” which are certain bits of data pattern, is performed in CED circuits in order to search a designated data pattern from input data. We designed an 8-bit 4-symbol CED circuit and confirmed its correct operation at 51.2 GHz. We also designed a CED circuit for variable number of symbols, which can detect different length of symbols, and confirmed its correct operation at 52.1 GHz. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Superconductor integrated circuits / SFQ circuits / pattern matching / CEP system |
| Paper # | SCE2017-6 |
| Date of Issue | 2017-04-14 (SCE) |
| Conference Information | |
| Committee | SCE |
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| Conference Date | 2017/4/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Devices, Thin film, etc. |
| Chair | Nobuyuki Yoshikawa(Yokohama National Univ.) |
| Vice Chair | |
| Secretary | (National Defense Academy) |
| Assistant | Hiroyuki Akaike(Nagoya Univ.) / Yuki Yamanashi(Yokohama National Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Superconductive Electronics |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Design and high speed test of an SFQ complex event detector circuit for complex event processing |
| Sub Title (in English) | |
| Keyword(1) | Superconductor integrated circuits |
| Keyword(2) | SFQ circuits |
| Keyword(3) | pattern matching |
| Keyword(4) | CEP system |
| 1st Author's Name | Ryosuke Sato |
| 1st Author's Affiliation | Yokohama National University(Yokohama Nat'l Univ.) |
| 2nd Author's Name | Tomohiro ono |
| 2nd Author's Affiliation | Yokohama National University(Yokohama Nat'l Univ.) |
| 3rd Author's Name | Yuki Yamanashi |
| 3rd Author's Affiliation | Yokohama National University(Yokohama Nat'l Univ.) |
| 4th Author's Name | Nobuyuki Yoshikawa |
| 4th Author's Affiliation | Yokohama National University(Yokohama Nat'l Univ.) |
| Date | 2017-04-21 |
| Paper # | SCE2017-6 |
| Volume (vol) | vol.117 |
| Number (no) | SCE-10 |
| Page | pp.pp.29-34(SCE), |
| #Pages | 6 |
| Date of Issue | 2017-04-14 (SCE) |