Presentation 2017-04-20
[Invited Talk] A 512Gb 3b/Cell Flash Memory on 64-Word-Line-Layer BiCS Technology
Ryuji Yamashita, Sagar Magia, Tsutomu Higuchi, Kazuhide Yoneya, Toshio Yamamura, Hiroyuki Mizukoshi, Shingo Zaitsu, Minoru Yamashita, Shunichi Toyama, Norihiro Kamae, Juan Lee, Shuo Chen, Jiawei Tao, William Mak, Xiaohua Zhang,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A 512Gb 3b/cell flash has been developed on a 64-WL-layer BiCS technology. By using a four-block-EOC row decoding approach, row decoder area is reduced by 18%, which translates to a 1.3% die size reduction. With additional layout area reduction techniques, a 132mm2 die size and 3.88Gb/mm2 bit density have been achieved. SBL current sensing achieved a 64μs tR with an 8KB page size, which is 20% less than a conventional 16KB-page ABL. USP operation expanded the Vt window by 15%, which has significantly improved endurance and reliability. This work confirms that it is possible to meet market requirements for bit density, cost, performance, and reliability with this 3D-flash technology.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 3D-flash / BiCS / 64-word-line-layer / NAND flash memory / Non-volatile memory
Paper # ICD2017-9
Date of Issue 2017-04-13 (ICD)

Conference Information
Committee ICD
Conference Date 2017/4/20(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Minoru Fujishima(Hiroshima Univ.)
Vice Chair Hideto Hidaka(Renesas)
Secretary Hideto Hidaka(Hiroshima Univ.)
Assistant Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.)

Paper Information
Registration To Technical Committee on Integrated Circuits and Devices
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] A 512Gb 3b/Cell Flash Memory on 64-Word-Line-Layer BiCS Technology
Sub Title (in English)
Keyword(1) 3D-flash
Keyword(2) BiCS
Keyword(3) 64-word-line-layer
Keyword(4) NAND flash memory
Keyword(5) Non-volatile memory
1st Author's Name Ryuji Yamashita
1st Author's Affiliation Western Digital(WDC)
2nd Author's Name Sagar Magia
2nd Author's Affiliation Western Digital(WDC)
3rd Author's Name Tsutomu Higuchi
3rd Author's Affiliation Toshiba(Toshiba)
4th Author's Name Kazuhide Yoneya
4th Author's Affiliation Toshiba(Toshiba)
5th Author's Name Toshio Yamamura
5th Author's Affiliation Toshiba(Toshiba)
6th Author's Name Hiroyuki Mizukoshi
6th Author's Affiliation Western Digital(WDC)
7th Author's Name Shingo Zaitsu
7th Author's Affiliation Western Digital(WDC)
8th Author's Name Minoru Yamashita
8th Author's Affiliation Western Digital(WDC)
9th Author's Name Shunichi Toyama
9th Author's Affiliation Western Digital(WDC)
10th Author's Name Norihiro Kamae
10th Author's Affiliation Western Digital(WDC)
11th Author's Name Juan Lee
11th Author's Affiliation Western Digital(WDC)
12th Author's Name Shuo Chen
12th Author's Affiliation Western Digital(WDC)
13th Author's Name Jiawei Tao
13th Author's Affiliation Western Digital(WDC)
14th Author's Name William Mak
14th Author's Affiliation Western Digital(WDC)
15th Author's Name Xiaohua Zhang
15th Author's Affiliation Western Digital(WDC)
Date 2017-04-20
Paper # ICD2017-9
Volume (vol) vol.117
Number (no) ICD-9
Page pp.pp.45-50(ICD),
#Pages 6
Date of Issue 2017-04-13 (ICD)