Presentation | 2017-03-03 Relationship of molten bridge and arcless commutation during current interruption of Hybrid DCCB Yuta Yamada, Chen Mo, Kyotaro Nakayama, Tatsuya Hayakawa, Shungo Zen, Koichi Yasuoka, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In recent years, with the increase in demand for DC power distribution, hybrid DC circuit breakers in which electrical contacts and semiconductor elements are connected in parallel have attracted attention. When SiC-MOSFET with low on-resistance is used as a semiconductor element, it is possible to realize arc-less interruption in which direct current is commutated from the contact to the semiconductor by the molten bridge voltage formed between the contacts when opening. In this paper, we investigate the commutation characteristics by varying the contact opening speed and the gap length, and investigate and discuss the stability of the molten bridge. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Hybrid DCCB / Molten bridge / SiC-MOSFET / arcless / gap length |
Paper # | EMD2016-103 |
Date of Issue | 2017-02-24 (EMD) |
Conference Information | |
Committee | EMD |
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Conference Date | 2017/3/3(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Yoshiteru Abe(NTT) |
Vice Chair | |
Secretary | (Sumitomo Denso) |
Assistant | Yoshiki Kayano(Univ. of Electro-Comm.) / Yuichi Hayashi(Tohoku Gakuin Univ.) |
Paper Information | |
Registration To | Technical Committee on Electromechanical Devices |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Relationship of molten bridge and arcless commutation during current interruption of Hybrid DCCB |
Sub Title (in English) | |
Keyword(1) | Hybrid DCCB |
Keyword(2) | Molten bridge |
Keyword(3) | SiC-MOSFET |
Keyword(4) | arcless |
Keyword(5) | gap length |
1st Author's Name | Yuta Yamada |
1st Author's Affiliation | Tokyo Institute of Technology(Titech) |
2nd Author's Name | Chen Mo |
2nd Author's Affiliation | Tokyo Institute of Technology(Titech) |
3rd Author's Name | Kyotaro Nakayama |
3rd Author's Affiliation | Tokyo Institute of Technology(Titech) |
4th Author's Name | Tatsuya Hayakawa |
4th Author's Affiliation | Tokyo Institute of Technology(Titech) |
5th Author's Name | Shungo Zen |
5th Author's Affiliation | Tokyo Institute of Technology(Titech) |
6th Author's Name | Koichi Yasuoka |
6th Author's Affiliation | Tokyo Institute of Technology(Titech) |
Date | 2017-03-03 |
Paper # | EMD2016-103 |
Volume (vol) | vol.116 |
Number (no) | EMD-492 |
Page | pp.pp.17-20(EMD), |
#Pages | 4 |
Date of Issue | 2017-02-24 (EMD) |