| Presentation | 2017-03-01 Secure Outage Probability Over κ-μ Fading Channels Shunya Iwata, Tomoaki Ohtsuki, Pooi Yuen Kam, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this report, we derive the analytical expressions for the secure outage probability in single-input single-output (SISO) system over fading, in which both the main and eavesdropper channels are subject to $kappa$-$mu$ fading. The $kappa$-$mu$ fading is a general model for well-known distributions that includes Rican, Nakagami-$m$, Rayleigh, and One-sided Gaussian distribution as special cases. Our result is an exact expression verified by Monte-Carlo simulations. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Physical layer security / secure outage probability / $kappa$-$mu$ fading channel / Nakagami-$m$ fading channel / Rician fading channel / probability of strictly positive secrecy capacity |
| Paper # | RCS2016-289 |
| Date of Issue | 2017-02-22 (RCS) |
| Conference Information | |
| Committee | RCS / SR / SRW |
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| Conference Date | 2017/3/1(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Tokyo Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Mobile Communication Workshop |
| Chair | Hidekazu Murata(Kyoto Univ.) / Takeo Fujii(Univ. of Electro-Comm.) / Hiroshi Harada(Kyoto Univ.) |
| Vice Chair | Satoshi Denno(Okayama Univ.) / Yukitoshi Sanada(Keio Univ.) / Eisuke Fukuda(Fujitsu Labs.) / Kenta Umebayashi(Tokyo Univ. of Agric. and Tech.) / Masayuki Ariyoshi(NEC) / Suguru Kameda(Tohoku Univ.) / Masafumi Kato(Fujitsu) / Satoshi Denno(Okayama Univ.) |
| Secretary | Satoshi Denno(Toshiba) / Yukitoshi Sanada(NTT DoCoMo) / Eisuke Fukuda(Shinshu Univ.) / Kenta Umebayashi(NICT) / Masayuki Ariyoshi(Tottori Univ.) / Suguru Kameda(NICT) / Masafumi Kato / Satoshi Denno |
| Assistant | Tetsuya Yamamoto(Panasonic) / Toshihiko Nishimura(Hokkaido Univ.) / Koichi Ishihara(NTT) / Kazushi Muraoka(NEC) / Shinsuke Ibi(Osaka Univ.) / Kazuto Yano(ATR) / Mamiko Inamori(Tokai Univ.) / Hiroyuki Shiba(NTT) / Gia Khanh Tran(Tokyo Inst. of Tech.) / Wen Yun(Fujitsu) / Keiichi Mizutani(Kyoto Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Radio Communication Systems / Technical Committee on Smart Radio / Technical Committee on Short Range Wireless Communications |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Secure Outage Probability Over κ-μ Fading Channels |
| Sub Title (in English) | |
| Keyword(1) | Physical layer security |
| Keyword(2) | secure outage probability |
| Keyword(3) | $kappa$-$mu$ fading channel |
| Keyword(4) | Nakagami-$m$ fading channel |
| Keyword(5) | Rician fading channel |
| Keyword(6) | probability of strictly positive secrecy capacity |
| 1st Author's Name | Shunya Iwata |
| 1st Author's Affiliation | Keio University(Keio Univ.) |
| 2nd Author's Name | Tomoaki Ohtsuki |
| 2nd Author's Affiliation | Keio University(Keio Univ.) |
| 3rd Author's Name | Pooi Yuen Kam |
| 3rd Author's Affiliation | National Univ. of Singapore(Keio Univ.) |
| Date | 2017-03-01 |
| Paper # | RCS2016-289 |
| Volume (vol) | vol.116 |
| Number (no) | RCS-479 |
| Page | pp.pp.1-6(RCS), |
| #Pages | 6 |
| Date of Issue | 2017-02-22 (RCS) |