Presentation | 2017-02-21 Design for Evaluation of TSV based Interconnections in 3D-SIC Shuichi Kameyama, Senling Wang, Hiroshi Takahashi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper introduces a concept of Design for Evaluation (DFE) that is a design method to embed circuits for quality evaluation of products into LSIs and/or boards. As a specific example of the DFE, we introduce a precise analog measuring circuit and technic for the TSV based interconnection resistance of 3D stacked IC (3D-SIC). In addition, we report the evaluated results for the feasibility of the method based on an experiment and the placement and routing design. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Design for Evaluation / DFE / 3D-SIC / Interconnect / 1149.1 / Analog Boundary Scan |
Paper # | DC2016-83 |
Date of Issue | 2017-02-14 (DC) |
Conference Information | |
Committee | DC |
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Conference Date | 2017/2/21(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | VLSI Design and Test, etc |
Chair | Michiko Inoue(NAIST) |
Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
Assistant |
Paper Information | |
Registration To | Technical Committee on Dependable Computing |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Design for Evaluation of TSV based Interconnections in 3D-SIC |
Sub Title (in English) | Interconnection Resistance Evaluation with Analog Boundary Scan |
Keyword(1) | Design for Evaluation |
Keyword(2) | DFE |
Keyword(3) | 3D-SIC |
Keyword(4) | Interconnect |
Keyword(5) | 1149.1 |
Keyword(6) | Analog Boundary Scan |
1st Author's Name | Shuichi Kameyama |
1st Author's Affiliation | Ehime University/Fujitsu Limited(Ehime Univ./Fujitsu) |
2nd Author's Name | Senling Wang |
2nd Author's Affiliation | Ehime University(Ehime Univ.) |
3rd Author's Name | Hiroshi Takahashi |
3rd Author's Affiliation | Ehime University(Ehime Univ.) |
Date | 2017-02-21 |
Paper # | DC2016-83 |
Volume (vol) | vol.116 |
Number (no) | DC-466 |
Page | pp.pp.53-58(DC), |
#Pages | 6 |
Date of Issue | 2017-02-14 (DC) |