| Presentation | 2017-02-21 An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination Daichi Yuruki, Satoshi Ohtake, Yoshiyuki Nakamura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Today, advancements of semiconductor technology have progress to high integration of LSI circuits. A technique which keeps quality of LSIs and reduces test cost is necessary. In this work, we tackle this problem with machine learning techniques: learning test results of LSIs by machine learning from the test data of LSIs produced in the past, and prediction if a newly produced LSI is good or defective using intermediate test results of the LSI, i.e, the cost of remaining tests for the LSI can be reduced. In this paper, we propose several techniques for distinction precision of good products and defective products for the test cost reduction and evaluate them by performing experiments. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Data mining / clustering / discriminant analysis / LSI testing |
| Paper # | DC2016-77 |
| Date of Issue | 2017-02-14 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2017/2/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc |
| Chair | Michiko Inoue(NAIST) |
| Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination |
| Sub Title (in English) | |
| Keyword(1) | Data mining |
| Keyword(2) | clustering |
| Keyword(3) | discriminant analysis |
| Keyword(4) | LSI testing |
| 1st Author's Name | Daichi Yuruki |
| 1st Author's Affiliation | Oita University(Oita Univ) |
| 2nd Author's Name | Satoshi Ohtake |
| 2nd Author's Affiliation | Oita University(Oita Univ) |
| 3rd Author's Name | Yoshiyuki Nakamura |
| 3rd Author's Affiliation | Renesas System Design Co., Ltd.(Renesas System Design) |
| Date | 2017-02-21 |
| Paper # | DC2016-77 |
| Volume (vol) | vol.116 |
| Number (no) | DC-466 |
| Page | pp.pp.17-22(DC), |
| #Pages | 6 |
| Date of Issue | 2017-02-14 (DC) |