Presentation | 2017-01-18 Analysis of spoof surface plasmons excited in a thin structure using the semi-implicit FDTD scheme based on the Newmark-Beta method Kazuhiro Fujita, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Spoof surface plasmons (SSPs) can be controlled by subwavelength structured metallic surfaces, and regarded as a concept to extend the conventional (optical) surface plasmons to low frequencies. Recently, it has been shown that the SSPs can guide a thin metallic film with subwavelength fine structures. This structure has a feature that dispersion curves of the SSP are insensitive to the depth of the film, and therefore many potential applications will be expected. On the other hand, when such thin structures are analyzed with the conventional finite-difference time-domain (FDTD) method, the maximum stable time step has to be reduced to ensure its numerical stability. This will lead to unwanted increase of total time steps. In order to avoid this problem, we use the recently proposed semi-implicit FDTD scheme [K. Fujita, IEICE Trans. Electron., Vol.J97-C, No.11, pp.429-440, 2014] based on the Newmark-Beta method. The effectiveness of the semi-implicit FDTD scheme is shown in the analysis of the SSPs excited in the thin metallic film. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | FDTD Method / Semi-implicit scheme / Newmark-Beta method / Stability / Spoof Surface Plasmons |
Paper # | PN2016-52,EMT2016-81,OPE2016-127,LQE2016-116,EST2016-91,MWP2016-65 |
Date of Issue | 2017-01-11 (PN, EMT, OPE, LQE, EST, MWP) |
Conference Information | |
Committee | OPE / EST / LQE / EMT / PN / MWP / IEE-EMT |
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Conference Date | 2017/1/18(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Iseshi Kanko Bunka Kaikan |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Kensuke Ogawa(Fujikura) / Hideaki Kimura(NTT) / Susumu Noda(Kyoto Univ.) / Motoyuki Sato(Tohoku Univ.) / Eiji Oki(Univ. of Electro-Comm.) / Yuichi Kado(Kyoto Inst. of Tech.) / Masahiro Tanaka(Gifu Univ.) |
Vice Chair | Kazutoshi Kato(Kyushu Univ.) / Shinichiro Ohnuki(Nihon Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.) / Tsuyoshi Yamamoto(Fujitsu Labs.) / Akira Hirose(Univ. of Tokyo) / Hiroshi Hasegawa(Nagoya Univ.) / Takehiro Tsuritani(KDDI Labs.) / Haruki Ogoshi(Furukawa Electric) / Tetsuya Kawanishi(Waseda Univ.) / Hiroyuki Toda(Doshisha Univ.) |
Secretary | Kazutoshi Kato(Keio Univ.) / Shinichiro Ohnuki(Mitsubishi Electric) / Akimasa Hirata(Muroran Inst. of Tech.) / Tsuyoshi Yamamoto(Tohoku Univ.) / Akira Hirose(NTT) / Hiroshi Hasegawa(Tohoku Univ.) / Takehiro Tsuritani(Mitsubishi Electric) / Haruki Ogoshi(Univ. of Hyogo) / Tetsuya Kawanishi(NICT) / Hiroyuki Toda(Osaka Univ.) / (ENRI) |
Assistant | Atsushi Aratake(NTT) / Katsumi Nakatsuhara(Kanagawa Inst. of Tech.) / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.) / / Tsuyoshi Matsuoka(Kyushu Sangyo Univ.) / Masahiro Nakagawa(NTT) / Soichiro Kametani(Mitsubishi Electric) / Kensuke Ikeda(CRIEPI) / Atsushi Kanno(NICT) / Yoshihiro NAKA(Kyushu University of Health and Welfare) |
Paper Information | |
Registration To | Technical Committee on OptoElectronics / Technical Committee on Electronics Simulation Technology / Technical Committee on Lasers and Quantum Electronics / Technical Committee on Electromagnetic Theory / Technical Committee on Photonic Network / Technical Committee on Microwave and Millimeter-wave Photonics / Technical Meeting on Electromagnetic Theory |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of spoof surface plasmons excited in a thin structure using the semi-implicit FDTD scheme based on the Newmark-Beta method |
Sub Title (in English) | |
Keyword(1) | FDTD Method |
Keyword(2) | Semi-implicit scheme |
Keyword(3) | Newmark-Beta method |
Keyword(4) | Stability |
Keyword(5) | Spoof Surface Plasmons |
1st Author's Name | Kazuhiro Fujita |
1st Author's Affiliation | Fujitsu Limited(Fujitsu) |
Date | 2017-01-18 |
Paper # | PN2016-52,EMT2016-81,OPE2016-127,LQE2016-116,EST2016-91,MWP2016-65 |
Volume (vol) | vol.116 |
Number (no) | PN-386,EMT-387,OPE-388,LQE-389,EST-390,MWP-391 |
Page | pp.pp.63-68(PN), pp.63-68(EMT), pp.63-68(OPE), pp.63-68(LQE), pp.63-68(EST), pp.63-68(MWP), |
#Pages | 6 |
Date of Issue | 2017-01-11 (PN, EMT, OPE, LQE, EST, MWP) |