| Presentation | 2017-01-31 Nondestructive OLED diagnostics by using optical EFISHG technique Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | By using electric-field-induced optical second-harmonic generation (EFISHG) measurement, we investigated non-destructive method for the detection of pre-electrical breakdown phenomena. In this paper, EFISHG measurements of double-layer organic light-emitting diodes (indium zinc oxide (IZO)/a-NPD/Alq3/Al) is presented to show remarkable carrier accumulation happens at the a-NPD/Alq3 interface as a pre-electrical breakdown phenomenon. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electric-field-induced optical second-harmonic generation / non-destructive measurement / organic light-emitting diode / Diagnostic method |
| Paper # | EMD2016-81,MR2016-53,SCE2016-59,EID2016-60,ED2016-124,CPM2016-125,SDM2016-124,ICD2016-112,OME2016-93 |
| Date of Issue | 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) |
| Conference Information | |
| Committee | ICD / CPM / ED / EID / EMD / MR / OME / SCE / SDM |
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| Conference Date | 2017/1/30(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Miyajima-Morino-Yado(Hiroshima) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Circuit, Device and Engineering Science |
| Chair | Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) / Koichi Maezawa(Univ. of Toyama) / Tomokazu Shiga(Univ. of Electro-Comm.) / Yoshiteru Abe(NTT) / Yoshihiro Okamoto(Ehime Univ.) / Naoki Matsuda(AIST) / Nobuyuki Yoshikawa(Yokohama National Univ.) / Tatsuya Kunikiyo(Renesas) |
| Vice Chair | Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) / Kunio Tsuda(Toshiba) / Mutsumi Kimura(Ryukoku Univ.) / Yuko Kominami(Shizuoka Univ.) / / / Tatsuo Mori(Aichi Inst. of Tech.) / / Takahiro Shinada(Tohoku Univ.) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) / Fumihiko Hirose(Univ. of Tokyo) / Kunio Tsuda(NTT) / Mutsumi Kimura(Nihon Univ.) / Yuko Kominami(JAIST) / (New JRC) / (NTT) / Tatsuo Mori(Tokyo Inst. of Tech.) / (Sumitomo Denso) / Takahiro Shinada(Fujielectric) |
| Assistant | Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) / Masataka Higashiwaki(NICT) / Toshiyuki Oishi(Saga Univ.) / Rumiko Yamaguchi(Akita Univ.) / Hiroyuki Nitta(Japan Display) / Mitsuru Nakata(NHK) / Takashi Kojiri(ZEON) / Ryosuke Nonaka(Toshiba) / Yoshiki Kayano(Univ. of Electro-Comm.) / Yuichi Hayashi(Tohoku Gakuin Univ.) / Kiwamu Kudo(Toshiba) / Shuhei Yoshida(Kinki Univ.) / Hirotake Kajii(Osaka Univ.) / Dai Taguchi(Tokyo Inst. of Tech.) / Hiroyuki Akaike(Nagoya Univ.) / Yuki Yamanashi(Yokohama National Univ.) / Hiroya Ikeda(Shizuoka Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices / Technical Committee on Electronic Information Displays / Technical Committee on Electromechanical Devices / Technical Committee on Magnetic Recording / Technical Committee on Organic Molecular Electronics / Technical Committee on Superconductive Electronics / Technical Committee on Silicon Device and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Nondestructive OLED diagnostics by using optical EFISHG technique |
| Sub Title (in English) | |
| Keyword(1) | electric-field-induced optical second-harmonic generation |
| Keyword(2) | non-destructive measurement |
| Keyword(3) | organic light-emitting diode |
| Keyword(4) | Diagnostic method |
| 1st Author's Name | Dai Taguchi |
| 1st Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| 2nd Author's Name | Takaaki Manaka |
| 2nd Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| 3rd Author's Name | Mitsumasa Iwamoto |
| 3rd Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| Date | 2017-01-31 |
| Paper # | EMD2016-81,MR2016-53,SCE2016-59,EID2016-60,ED2016-124,CPM2016-125,SDM2016-124,ICD2016-112,OME2016-93 |
| Volume (vol) | vol.116 |
| Number (no) | EMD-439,MR-440,SCE-441,EID-442,ED-443,CPM-444,SDM-445,ICD-446,OME-447 |
| Page | pp.pp.59-64(EMD), pp.59-64(MR), pp.59-64(SCE), pp.59-64(EID), pp.59-64(ED), pp.59-64(CPM), pp.59-64(SDM), pp.59-64(ICD), pp.59-64(OME), |
| #Pages | 6 |
| Date of Issue | 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) |