Presentation | 2017-01-31 [Invited Talk] Experimental Study on Operation Speed of Negative Capacitance FET with Ferroelectric HfO2 Masaharu Kobayashi, Nozomu Ueyama, Kyungmin Jang, Toshiro Hiramoto, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EMD2016-79,MR2016-51,SCE2016-57,EID2016-58,ED2016-122,CPM2016-123,SDM2016-122,ICD2016-110,OME2016-91 |
Date of Issue | 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) |
Conference Information | |
Committee | ICD / CPM / ED / EID / EMD / MR / OME / SCE / SDM |
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Conference Date | 2017/1/30(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Miyajima-Morino-Yado(Hiroshima) |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Circuit, Device and Engineering Science |
Chair | Minoru Fujishima(Hiroshima Univ.) / Satoru Noge(Numazu National College of Tech.) / Koichi Maezawa(Univ. of Toyama) / Tomokazu Shiga(Univ. of Electro-Comm.) / Yoshiteru Abe(NTT) / Yoshihiro Okamoto(Ehime Univ.) / Naoki Matsuda(AIST) / Nobuyuki Yoshikawa(Yokohama National Univ.) / Tatsuya Kunikiyo(Renesas) |
Vice Chair | Hideto Hidaka(Renesas) / Fumihiko Hirose(Yamagata Univ.) / Kunio Tsuda(Toshiba) / Mutsumi Kimura(Ryukoku Univ.) / Yuko Kominami(Shizuoka Univ.) / / / Tatsuo Mori(Aichi Inst. of Tech.) / / Takahiro Shinada(Tohoku Univ.) |
Secretary | Hideto Hidaka(Hiroshima Univ.) / Fumihiko Hirose(Univ. of Tokyo) / Kunio Tsuda(NTT) / Mutsumi Kimura(Nihon Univ.) / Yuko Kominami(JAIST) / (New JRC) / (NTT) / Tatsuo Mori(Tokyo Inst. of Tech.) / (Sumitomo Denso) / Takahiro Shinada(Fujielectric) |
Assistant | Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) / Masataka Higashiwaki(NICT) / Toshiyuki Oishi(Saga Univ.) / Rumiko Yamaguchi(Akita Univ.) / Hiroyuki Nitta(Japan Display) / Mitsuru Nakata(NHK) / Takashi Kojiri(ZEON) / Ryosuke Nonaka(Toshiba) / Yoshiki Kayano(Univ. of Electro-Comm.) / Yuichi Hayashi(Tohoku Gakuin Univ.) / Kiwamu Kudo(Toshiba) / Shuhei Yoshida(Kinki Univ.) / Hirotake Kajii(Osaka Univ.) / Dai Taguchi(Tokyo Inst. of Tech.) / Hiroyuki Akaike(Nagoya Univ.) / Yuki Yamanashi(Yokohama National Univ.) / Hiroya Ikeda(Shizuoka Univ.) |
Paper Information | |
Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Component Parts and Materials / Technical Committee on Electron Devices / Technical Committee on Electronic Information Displays / Technical Committee on Electromechanical Devices / Technical Committee on Magnetic Recording / Technical Committee on Organic Molecular Electronics / Technical Committee on Superconductive Electronics / Technical Committee on Silicon Device and Materials |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | [Invited Talk] Experimental Study on Operation Speed of Negative Capacitance FET with Ferroelectric HfO2 |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Masaharu Kobayashi |
1st Author's Affiliation | The University of Tokyo(IIS, Univ. of Tokyo) |
2nd Author's Name | Nozomu Ueyama |
2nd Author's Affiliation | The University of Tokyo(IIS, Univ. of Tokyo) |
3rd Author's Name | Kyungmin Jang |
3rd Author's Affiliation | The University of Tokyo(IIS, Univ. of Tokyo) |
4th Author's Name | Toshiro Hiramoto |
4th Author's Affiliation | The University of Tokyo(IIS, Univ. of Tokyo) |
Date | 2017-01-31 |
Paper # | EMD2016-79,MR2016-51,SCE2016-57,EID2016-58,ED2016-122,CPM2016-123,SDM2016-122,ICD2016-110,OME2016-91 |
Volume (vol) | vol.116 |
Number (no) | EMD-439,MR-440,SCE-441,EID-442,ED-443,CPM-444,SDM-445,ICD-446,OME-447 |
Page | pp.pp.51-54(EMD), pp.51-54(MR), pp.51-54(SCE), pp.51-54(EID), pp.51-54(ED), pp.51-54(CPM), pp.51-54(SDM), pp.51-54(ICD), pp.51-54(OME), |
#Pages | 4 |
Date of Issue | 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) |