Presentation 2017-01-26
Gate delay evaluation in a large-sized display
Chihiro Tsukii, Chang-Hoon Shim, Reiji Hattori,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this study, we have extracted the gate line resistance and the parasitic capacitance per subpixel of active matrix liquid crystal display (AMLCD) and active matrix organic light-emitting diode display (AMOLED). Furthermore, we investigated the effect of gate delay on distributed RC line by SPICE simulation. As a result, in a large high-definition display of 4 K or more, the time constant at the rising of the gate signal becomes larger than the select time of the switching TFT, so that the dullness of the gate signal waveform cannot be ignored. Therefore, it is necessary to arrange the gate driver and the source driver on both sides of the display and drive the display in quarters. With these methods, the load can be reduced and the select time can be expanded.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Gate delay / Distributed RC line / 4K / 8K / AMLCD / AMOLED / TFT
Paper # EID2016-32
Date of Issue 2017-01-19 (EID)

Conference Information
Committee EID / ITE-IDY / IEE-EDD / IEIJ-SSL / SID-JC
Conference Date 2017/1/26(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Tokushima Univ.
Topics (in Japanese) (See Japanese page)
Topics (in English) Joint Meeting of Emissive/Non-emissive Displays
Chair Tomokazu Shiga(Univ. of Electro-Comm.) / Keiichi Betsui(Hitachi)
Vice Chair Mutsumi Kimura(Ryukoku Univ.) / Yuko Kominami(Shizuoka Univ.) / Yoshihide Fujisaki(NHK)
Secretary Mutsumi Kimura(NTT) / Yuko Kominami(Tokyo Inst. of Tech.) / Yoshihide Fujisaki(Shizuoka Univ.)
Assistant Rumiko Yamaguchi(Akita Univ.) / Hiroyuki Nitta(Japan Display) / Mitsuru Nakata(NHK) / Takashi Kojiri(ZEON) / Ryosuke Nonaka(Toshiba)

Paper Information
Registration To Technical Committee on Electronic Information Displays / Technical Group on Information Display / Technical Group on Electron Devices / * / Society for Information Display Japan Chapter
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Gate delay evaluation in a large-sized display
Sub Title (in English)
Keyword(1) Gate delay
Keyword(2) Distributed RC line
Keyword(3) 4K
Keyword(4) 8K
Keyword(5) AMLCD
Keyword(6) AMOLED
Keyword(7) TFT
1st Author's Name Chihiro Tsukii
1st Author's Affiliation Kyushu University(Kyushu Univ.)
2nd Author's Name Chang-Hoon Shim
2nd Author's Affiliation Kyushu University(Kyushu Univ.)
3rd Author's Name Reiji Hattori
3rd Author's Affiliation Kyushu University(Kyushu Univ.)
Date 2017-01-26
Paper # EID2016-32
Volume (vol) vol.116
Number (no) EID-430
Page pp.pp.29-32(EID),
#Pages 4
Date of Issue 2017-01-19 (EID)