Presentation | 2017-01-26 Gate delay evaluation in a large-sized display Chihiro Tsukii, Chang-Hoon Shim, Reiji Hattori, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this study, we have extracted the gate line resistance and the parasitic capacitance per subpixel of active matrix liquid crystal display (AMLCD) and active matrix organic light-emitting diode display (AMOLED). Furthermore, we investigated the effect of gate delay on distributed RC line by SPICE simulation. As a result, in a large high-definition display of 4 K or more, the time constant at the rising of the gate signal becomes larger than the select time of the switching TFT, so that the dullness of the gate signal waveform cannot be ignored. Therefore, it is necessary to arrange the gate driver and the source driver on both sides of the display and drive the display in quarters. With these methods, the load can be reduced and the select time can be expanded. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Gate delay / Distributed RC line / 4K / 8K / AMLCD / AMOLED / TFT |
Paper # | EID2016-32 |
Date of Issue | 2017-01-19 (EID) |
Conference Information | |
Committee | EID / ITE-IDY / IEE-EDD / IEIJ-SSL / SID-JC |
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Conference Date | 2017/1/26(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Tokushima Univ. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Joint Meeting of Emissive/Non-emissive Displays |
Chair | Tomokazu Shiga(Univ. of Electro-Comm.) / Keiichi Betsui(Hitachi) |
Vice Chair | Mutsumi Kimura(Ryukoku Univ.) / Yuko Kominami(Shizuoka Univ.) / Yoshihide Fujisaki(NHK) |
Secretary | Mutsumi Kimura(NTT) / Yuko Kominami(Tokyo Inst. of Tech.) / Yoshihide Fujisaki(Shizuoka Univ.) |
Assistant | Rumiko Yamaguchi(Akita Univ.) / Hiroyuki Nitta(Japan Display) / Mitsuru Nakata(NHK) / Takashi Kojiri(ZEON) / Ryosuke Nonaka(Toshiba) |
Paper Information | |
Registration To | Technical Committee on Electronic Information Displays / Technical Group on Information Display / Technical Group on Electron Devices / * / Society for Information Display Japan Chapter |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Gate delay evaluation in a large-sized display |
Sub Title (in English) | |
Keyword(1) | Gate delay |
Keyword(2) | Distributed RC line |
Keyword(3) | 4K |
Keyword(4) | 8K |
Keyword(5) | AMLCD |
Keyword(6) | AMOLED |
Keyword(7) | TFT |
1st Author's Name | Chihiro Tsukii |
1st Author's Affiliation | Kyushu University(Kyushu Univ.) |
2nd Author's Name | Chang-Hoon Shim |
2nd Author's Affiliation | Kyushu University(Kyushu Univ.) |
3rd Author's Name | Reiji Hattori |
3rd Author's Affiliation | Kyushu University(Kyushu Univ.) |
Date | 2017-01-26 |
Paper # | EID2016-32 |
Volume (vol) | vol.116 |
Number (no) | EID-430 |
Page | pp.pp.29-32(EID), |
#Pages | 4 |
Date of Issue | 2017-01-19 (EID) |