Presentation 2016-12-16
High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC
Gian Mayuga, Yuta Yamato, Yasuo Sato, Michiko Inoue,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # DC2016-64
Date of Issue 2016-12-09 (DC)

Conference Information
Committee DC
Conference Date 2016/12/16(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Sakata Sogo-Bunka Center(Sakata-City)
Topics (in Japanese) (See Japanese page)
Topics (in English) Winter Workshop on safety
Chair Michiko Inoue(NAIST)
Vice Chair Satoshi Fukumoto(Tokyo Metropolitan Univ.)
Secretary Satoshi Fukumoto(Kyoto Sangyo Univ.)
Assistant

Paper Information
Registration To Technical Committee on Dependable Computing
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC
Sub Title (in English)
Keyword(1)
1st Author's Name Gian Mayuga
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Yuta Yamato
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yasuo Sato
3rd Author's Affiliation Kyushu Institute of Technology(KIT)
4th Author's Name Michiko Inoue
4th Author's Affiliation Nara Institute of Science and Technology(NAIST)
Date 2016-12-16
Paper # DC2016-64
Volume (vol) vol.116
Number (no) DC-373
Page pp.pp.1-6(DC),
#Pages 6
Date of Issue 2016-12-09 (DC)