| Presentation | 2016-11-17 A Study on Electro Chemical Migration Test for Printed Circuit Board Sadanori Ito, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The electro chemical migration which shorts the electric circuit occurs under the various use condition such as High Temperature - High Humidity/ Temperature-Humidity Cycle/ Dew condensation Cycle / High Temperature. So, not the unique standard test method but the test method against the suitable purpose is needed. Considering the occurred mechanism via the various electro chemical migration examples, we study the necessary test method and the evaluation method for the soldering printed circuit board |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electro Chemical Migration / Temperature-Humidity Cycle test / Dew condensation Cycle test |
| Paper # | R2016-52 |
| Date of Issue | 2016-11-10 (R) |
| Conference Information | |
| Committee | R |
|---|---|
| Conference Date | 2016/11/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Osaka Central Electric Club Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Reliability for semiconductors and electronics devices, Overall reliability engineering (co-organized by Reliability Engineering Association of Japan Kansai Branch) |
| Chair | Hiroyasu Mawatari(NTT) |
| Vice Chair | Tetsushi Yuge(National Defense Academy) |
| Secretary | Tetsushi Yuge(Fujitsu) |
| Assistant | Maratt Zanikef(Kyushu Inst. of Tech.) / Nobuyuki Tamura(Hosei Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Reliability |
|---|---|
| Language | JPN-ONLY |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on Electro Chemical Migration Test for Printed Circuit Board |
| Sub Title (in English) | |
| Keyword(1) | Electro Chemical Migration |
| Keyword(2) | Temperature-Humidity Cycle test |
| Keyword(3) | Dew condensation Cycle test |
| 1st Author's Name | Sadanori Ito |
| 1st Author's Affiliation | Itoken Office(Itoken) |
| Date | 2016-11-17 |
| Paper # | R2016-52 |
| Volume (vol) | vol.116 |
| Number (no) | R-301 |
| Page | pp.pp.19-22(R), |
| #Pages | 4 |
| Date of Issue | 2016-11-10 (R) |