Presentation 2016-10-21
S-parameter estimation method for multi-port circuit using T parameters of fixture
Yuuya Kojima, Toshikazu Sekine, Yasuhiro Takahashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A method estimating S-parameters of n-port circuit connected to (m+n)-port fixture is described. Especiallythe case where m and n are different is investigated. First, T-parameters of the (m+n)-port fixture can beobtained from the measured values of the S-parameters between the remaining port with the known loads insteadof the circuit under test. Next, S-parameters of the n-port circuit under test can be obtained by removing thecharacteristics of (m+n)-port fixture from the measured values. The advantage of using the T parameter of thefixture is that the estimation equations are linear equations. When the number of measurement port is greater thanthe number of ports of the circuit under test, T parameters of the fixture can be estimated. Then, S parameters ofthe n-port circuit under test is obtained. Numerical example to verify the validity of the method is shown.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) S-parameters measurement / de-embedding / T-parameters / multi-port circuit
Paper # EMCJ2016-80,MW2016-112,EST2016-76
Date of Issue 2016-10-13 (EMCJ, MW, EST)

Conference Information
Committee EMCJ / IEE-EMC / MW / EST
Conference Date 2016/10/20(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Tohoku Univ.
Topics (in Japanese) (See Japanese page)
Topics (in English) Microwave, Electromagnetic simulation, EMC, etc.
Chair Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Yohei Ishikawa(Kyoto Univ.) / Hideaki Kimura(NTT)
Vice Chair Osami Wada(Kyoto Univ.) / / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Kenichi Tajima(Mitsubishi Electric) / Shinichiro Ohnuki(Nihon Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.)
Secretary Osami Wada(AIST) / (Hitachi Automotive Systems) / Takao Kuki(Osaka Univ.) / Kenjiro Nishikawa(NMRI) / Kenichi Tajima(Panasonic) / Shinichiro Ohnuki(Tokyo Inst. of Tech.) / Akimasa Hirata(Muroran Inst. of Tech.)
Assistant Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Naoto Sekiya(Univ. of Yamanashi) / Satoshi Ono(Univ. of Electro-Comm.) / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) S-parameter estimation method for multi-port circuit using T parameters of fixture
Sub Title (in English) the number of ports of the measurement and multi-port circuit is not equal
Keyword(1) S-parameters measurement
Keyword(2) de-embedding
Keyword(3) T-parameters
Keyword(4) multi-port circuit
1st Author's Name Yuuya Kojima
1st Author's Affiliation Gifu University(Gifu Univ.)
2nd Author's Name Toshikazu Sekine
2nd Author's Affiliation Gifu University(Gifu Univ.)
3rd Author's Name Yasuhiro Takahashi
3rd Author's Affiliation Gifu University(Gifu Univ.)
Date 2016-10-21
Paper # EMCJ2016-80,MW2016-112,EST2016-76
Volume (vol) vol.116
Number (no) EMCJ-253,MW-254,EST-255
Page pp.pp.119-124(EMCJ), pp.119-124(MW), pp.119-124(EST),
#Pages 6
Date of Issue 2016-10-13 (EMCJ, MW, EST)