| Presentation | 2016-10-21 Attempt for Determining Cryptographic Circuit Blocks Leaking Side-Channel Information Based on Internal Current Source Kengo Iokibe, Naoki Kawata, Yusuke Yano, Hiroto Kagotani, Yoshitaka Toyota, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | For efficient security enhancement of cryptographic ICs against side-channel attacks (SCAs), it is important to identify the circuit part that leaks information. In this study, we observed variation in information leakage behavior of different FPGA implementations of cryptographic circuits. The observation was based on EMC macro-model that could be useful in evaluating cryptographic circuits in terms of vulnerability to SCAs. First, we implemented four advanced encryption standard (AES) circuits on the FPGA. They were different in strength of SCA countermeasure. Next, we measured impedance of power network of FPGA for the four implementations to identify the EMC macro-model. The measured impedances were found that they had different resistances in the low frequency range. Then we identified the equivalent current source of FPGA core circuit and finally analyzed the current source by the correlation power analysis (CPA) method, one of the most powerful analysis methods in SCAs. We found that differences in strength of the SCA countermeasure were distinguishable in traces of correlation coefficients that were resultant of CPA. This suggested that the EMC macro-model could be useful for SCA vulnerability evaluation of cryptographic circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EM information leakage / side-channel attack / EMC macro model / equivalent circuit / correlation power analysis / Advanced Encryption Standard / cryptograph |
| Paper # | EMCJ2016-74,MW2016-106,EST2016-70 |
| Date of Issue | 2016-10-13 (EMCJ, MW, EST) |
| Conference Information | |
| Committee | EMCJ / IEE-EMC / MW / EST |
|---|---|
| Conference Date | 2016/10/20(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Tohoku Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave, Electromagnetic simulation, EMC, etc. |
| Chair | Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Yohei Ishikawa(Kyoto Univ.) / Hideaki Kimura(NTT) |
| Vice Chair | Osami Wada(Kyoto Univ.) / / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Kenichi Tajima(Mitsubishi Electric) / Shinichiro Ohnuki(Nihon Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.) |
| Secretary | Osami Wada(AIST) / (Hitachi Automotive Systems) / Takao Kuki(Osaka Univ.) / Kenjiro Nishikawa(NMRI) / Kenichi Tajima(Panasonic) / Shinichiro Ohnuki(Tokyo Inst. of Tech.) / Akimasa Hirata(Muroran Inst. of Tech.) |
| Assistant | Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Naoto Sekiya(Univ. of Yamanashi) / Satoshi Ono(Univ. of Electro-Comm.) / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Attempt for Determining Cryptographic Circuit Blocks Leaking Side-Channel Information Based on Internal Current Source |
| Sub Title (in English) | Examination with FPGA Implementation of AES Circuits |
| Keyword(1) | EM information leakage |
| Keyword(2) | side-channel attack |
| Keyword(3) | EMC macro model |
| Keyword(4) | equivalent circuit |
| Keyword(5) | correlation power analysis |
| Keyword(6) | Advanced Encryption Standard |
| Keyword(7) | cryptograph |
| 1st Author's Name | Kengo Iokibe |
| 1st Author's Affiliation | Okayama University(Okayama Univ.) |
| 2nd Author's Name | Naoki Kawata |
| 2nd Author's Affiliation | Okayama University(Okayama Univ.) |
| 3rd Author's Name | Yusuke Yano |
| 3rd Author's Affiliation | Okayama University(Okayama Univ.) |
| 4th Author's Name | Hiroto Kagotani |
| 4th Author's Affiliation | Okayama University(Okayama Univ.) |
| 5th Author's Name | Yoshitaka Toyota |
| 5th Author's Affiliation | Okayama University(Okayama Univ.) |
| Date | 2016-10-21 |
| Paper # | EMCJ2016-74,MW2016-106,EST2016-70 |
| Volume (vol) | vol.116 |
| Number (no) | EMCJ-253,MW-254,EST-255 |
| Page | pp.pp.79-84(EMCJ), pp.79-84(MW), pp.79-84(EST), |
| #Pages | 6 |
| Date of Issue | 2016-10-13 (EMCJ, MW, EST) |