Presentation | 2016-10-20 Results of EMC round robin test on emission and immunity test. Yoshitsugu Okuda, Masahiro Inoue, Hiro Shida, Hisashi Ninomiya, Kenji Masaoka, Minoru Yamanaka, Osami Wada, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In the previous report, we explained Round-Robin tests on radiated and conducted emission test research report/result. In this report, we reveal methods and procedures of Round-Robin test on radiated immunity test conducted by KEC’s EMC Special Committee Working Group, as well as we report and examine the results of the Round-Robin testes from the participating organizations. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | EMC / round robin test / Comparison Test / Radiated Immunity / IEC61000-4-3 |
Paper # | EMCJ2016-61,MW2016-93,EST2016-57 |
Date of Issue | 2016-10-13 (EMCJ, MW, EST) |
Conference Information | |
Committee | EMCJ / IEE-EMC / MW / EST |
---|---|
Conference Date | 2016/10/20(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Tohoku Univ. |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Microwave, Electromagnetic simulation, EMC, etc. |
Chair | Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Yohei Ishikawa(Kyoto Univ.) / Hideaki Kimura(NTT) |
Vice Chair | Osami Wada(Kyoto Univ.) / / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Kenichi Tajima(Mitsubishi Electric) / Shinichiro Ohnuki(Nihon Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.) |
Secretary | Osami Wada(AIST) / (Hitachi Automotive Systems) / Takao Kuki(Osaka Univ.) / Kenjiro Nishikawa(NMRI) / Kenichi Tajima(Panasonic) / Shinichiro Ohnuki(Tokyo Inst. of Tech.) / Akimasa Hirata(Muroran Inst. of Tech.) |
Assistant | Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Naoto Sekiya(Univ. of Yamanashi) / Satoshi Ono(Univ. of Electro-Comm.) / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.) |
Paper Information | |
Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Results of EMC round robin test on emission and immunity test. |
Sub Title (in English) | (2) Radiated immunity round robin test |
Keyword(1) | EMC |
Keyword(2) | round robin test |
Keyword(3) | Comparison Test |
Keyword(4) | Radiated Immunity |
Keyword(5) | IEC61000-4-3 |
1st Author's Name | Yoshitsugu Okuda |
1st Author's Affiliation | KEC Kansai Electronic Industry Development Center(KEC) |
2nd Author's Name | Masahiro Inoue |
2nd Author's Affiliation | KEC Kansai Electronic Industry Development Center(KEC) |
3rd Author's Name | Hiro Shida |
3rd Author's Affiliation | Tokin EMC Engineering Co., Ltd.(Tokin) |
4th Author's Name | Hisashi Ninomiya |
4th Author's Affiliation | Roland(Roland) |
5th Author's Name | Kenji Masaoka |
5th Author's Affiliation | KEC Kansai Electronic Industry Development Center(KEC) |
6th Author's Name | Minoru Yamanaka |
6th Author's Affiliation | UL Japan(UL) |
7th Author's Name | Osami Wada |
7th Author's Affiliation | Kyoto University(Kyo Dai) |
Date | 2016-10-20 |
Paper # | EMCJ2016-61,MW2016-93,EST2016-57 |
Volume (vol) | vol.116 |
Number (no) | EMCJ-253,MW-254,EST-255 |
Page | pp.pp.5-10(EMCJ), pp.5-10(MW), pp.5-10(EST), |
#Pages | 6 |
Date of Issue | 2016-10-13 (EMCJ, MW, EST) |