Presentation 2016-10-20
Results of EMC round robin test on emission and immunity test.
Yoshitsugu Okuda, Masahiro Inoue, Hiro Shida, Hisashi Ninomiya, Kenji Masaoka, Minoru Yamanaka, Osami Wada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the previous report, we explained Round-Robin tests on radiated and conducted emission test research report/result. In this report, we reveal methods and procedures of Round-Robin test on radiated immunity test conducted by KEC’s EMC Special Committee Working Group, as well as we report and examine the results of the Round-Robin testes from the participating organizations.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMC / round robin test / Comparison Test / Radiated Immunity / IEC61000-4-3
Paper # EMCJ2016-61,MW2016-93,EST2016-57
Date of Issue 2016-10-13 (EMCJ, MW, EST)

Conference Information
Committee EMCJ / IEE-EMC / MW / EST
Conference Date 2016/10/20(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Tohoku Univ.
Topics (in Japanese) (See Japanese page)
Topics (in English) Microwave, Electromagnetic simulation, EMC, etc.
Chair Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Yohei Ishikawa(Kyoto Univ.) / Hideaki Kimura(NTT)
Vice Chair Osami Wada(Kyoto Univ.) / / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Kenichi Tajima(Mitsubishi Electric) / Shinichiro Ohnuki(Nihon Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.)
Secretary Osami Wada(AIST) / (Hitachi Automotive Systems) / Takao Kuki(Osaka Univ.) / Kenjiro Nishikawa(NMRI) / Kenichi Tajima(Panasonic) / Shinichiro Ohnuki(Tokyo Inst. of Tech.) / Akimasa Hirata(Muroran Inst. of Tech.)
Assistant Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Naoto Sekiya(Univ. of Yamanashi) / Satoshi Ono(Univ. of Electro-Comm.) / Atsushi Kezuka(ENRI) / Kenji Taguchi(Kitami Inst. of Tech.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Results of EMC round robin test on emission and immunity test.
Sub Title (in English) (2) Radiated immunity round robin test
Keyword(1) EMC
Keyword(2) round robin test
Keyword(3) Comparison Test
Keyword(4) Radiated Immunity
Keyword(5) IEC61000-4-3
1st Author's Name Yoshitsugu Okuda
1st Author's Affiliation KEC Kansai Electronic Industry Development Center(KEC)
2nd Author's Name Masahiro Inoue
2nd Author's Affiliation KEC Kansai Electronic Industry Development Center(KEC)
3rd Author's Name Hiro Shida
3rd Author's Affiliation Tokin EMC Engineering Co., Ltd.(Tokin)
4th Author's Name Hisashi Ninomiya
4th Author's Affiliation Roland(Roland)
5th Author's Name Kenji Masaoka
5th Author's Affiliation KEC Kansai Electronic Industry Development Center(KEC)
6th Author's Name Minoru Yamanaka
6th Author's Affiliation UL Japan(UL)
7th Author's Name Osami Wada
7th Author's Affiliation Kyoto University(Kyo Dai)
Date 2016-10-20
Paper # EMCJ2016-61,MW2016-93,EST2016-57
Volume (vol) vol.116
Number (no) EMCJ-253,MW-254,EST-255
Page pp.pp.5-10(EMCJ), pp.5-10(MW), pp.5-10(EST),
#Pages 6
Date of Issue 2016-10-13 (EMCJ, MW, EST)