| Presentation | 2016-09-16 [Invited Lecture] Development of an automatic calibration system for artificial mains network Ryoko Kishikawa, Hiroki Ozone, Masahumi Mori, Kazunari Suzuki, Masaaki Shida, Masahiro Horibe, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to utilize electronic devices safely, electromagnetic compatibility (EMC) tests have been performed. An artificial mains network (AMN) is one of the test instruments for EMC tests. Because it is possible that it will be a bad influence on test results, it must be calibrated before the tests. We have developed a new method for calibrating it and an automatic calibration system based on the method to perform calibrations with high reliability and in a short time. We can easily construct a traceability to the national metrology standard with the method. Using the automatic calibrating system, a time for calibration is shortened. We proved its reliability by temperature and humidity tests and measurement repeatability tests. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electromagnetic compatibility (EMC) / impedance / phase / vector network analyzer (VNA) / calibration / traceability |
| Paper # | AP2016-101,MW2016-87 |
| Date of Issue | 2016-09-08 (AP, MW) |
| Conference Information | |
| Committee | AP / MW |
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| Conference Date | 2016/9/15(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | AIST |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave, Millimeter wave, Measurement, Antennas and Propagation |
| Chair | Keizo Cho(Chiba Inst. of Tech.) / Yohei Ishikawa(Kyoto Univ.) |
| Vice Chair | Hisato Iwai(Doshisha Univ.) / Takao Kuki(Kokushikan Univ.) / Kenjiro Nishikawa(Kagoshima Univ.) / Kenichi Tajima(Mitsubishi Electric) |
| Secretary | Hisato Iwai(Niigata Univ.) / Takao Kuki(NTT DoCoMo) / Kenjiro Nishikawa(Panasonic) / Kenichi Tajima(Tokyo Inst. of Tech.) |
| Assistant | Nobuyasu Takemura(Nippon Inst. of Tech.) / Satoshi Yamaguchi(Mitsubishi Electric) / Naoto Sekiya(Univ. of Yamanashi) / Satoshi Ono(Univ. of Electro-Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Antennas and Propagation / Technical Committee on Microwaves |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] Development of an automatic calibration system for artificial mains network |
| Sub Title (in English) | |
| Keyword(1) | electromagnetic compatibility (EMC) |
| Keyword(2) | impedance |
| Keyword(3) | phase |
| Keyword(4) | vector network analyzer (VNA) |
| Keyword(5) | calibration |
| Keyword(6) | traceability |
| 1st Author's Name | Ryoko Kishikawa |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| 2nd Author's Name | Hiroki Ozone |
| 2nd Author's Affiliation | Repic corporation(REPIC) |
| 3rd Author's Name | Masahumi Mori |
| 3rd Author's Affiliation | Repic corporation(REPIC) |
| 4th Author's Name | Kazunari Suzuki |
| 4th Author's Affiliation | Repic corporation(REPIC) |
| 5th Author's Name | Masaaki Shida |
| 5th Author's Affiliation | Repic corporation(REPIC) |
| 6th Author's Name | Masahiro Horibe |
| 6th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| Date | 2016-09-16 |
| Paper # | AP2016-101,MW2016-87 |
| Volume (vol) | vol.116 |
| Number (no) | AP-218,MW-219 |
| Page | pp.pp.69-74(AP), pp.77-82(MW), |
| #Pages | 6 |
| Date of Issue | 2016-09-08 (AP, MW) |