Presentation 2016-08-03
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs
Yasuhiro Ogasahara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new structure devices on ultra-low voltage circuits. Our simulation results based on PTM 22nm model clarify applicability of ultra-low voltage operation to a nominal speed common SoC designs by an introduction of Vth control as well as low power sensor nodes. We also reveal requirement of process variability suppression for high energy efficiency with steep SS transistors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) process variability / adaptive body bias / ultra-low voltage circuits / energy efficiency
Paper # SDM2016-65,ICD2016-33
Date of Issue 2016-07-25 (SDM, ICD)

Conference Information
Committee ICD / SDM / ITE-IST
Conference Date 2016/8/1(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Central Electric Club
Topics (in Japanese) (See Japanese page)
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications
Chair Minoru Fujishima(Hiroshima Univ.) / Tatsuya Kunikiyo(Renesas) / Shigetoshi Sugawa(Tohoku Univ.)
Vice Chair Hideto Hidaka(Renesas) / Takahiro Shinada(Tohoku Univ.) / Takayuki Hamamoto(東京理科大) / Hiroshi Ohtake(NHK)
Secretary Hideto Hidaka(Hiroshima Univ.) / Takahiro Shinada(Univ. of Tokyo) / Takayuki Hamamoto(Tohoku Univ.) / Hiroshi Ohtake(Renesas)
Assistant Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Hiroya Ikeda(Shizuoka Univ.)

Paper Information
Registration To Technical Committee on Integrated Circuits and Devices / Technical Committee on Silicon Device and Materials / Technical Group on Information Sensing Technologies
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs
Sub Title (in English)
Keyword(1) process variability
Keyword(2) adaptive body bias
Keyword(3) ultra-low voltage circuits
Keyword(4) energy efficiency
1st Author's Name Yasuhiro Ogasahara
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
Date 2016-08-03
Paper # SDM2016-65,ICD2016-33
Volume (vol) vol.116
Number (no) SDM-172,ICD-173
Page pp.pp.111-116(SDM), pp.111-116(ICD),
#Pages 6
Date of Issue 2016-07-25 (SDM, ICD)