Presentation 2016-07-29
Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability
Akihiko Masuda, Tateki Nishi, Hiroyuki Goto, Ko Kawashima, Fumiaki Harada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # R2016-17
Date of Issue 2016-07-22 (R)

Conference Information
Committee R
Conference Date 2016/7/29(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Otaru Chamber of Commerce and Industry
Topics (in Japanese) (See Japanese page)
Topics (in English) Reliability theory, Reliability for communication network, Overall reliability engineering
Chair Hiroyasu Mawatari(NTT)
Vice Chair Tetsushi Yuge(National Defense Academy)
Secretary Tetsushi Yuge(Fujitsu)
Assistant Maratt Zanikef(Kyushu Inst. of Tech.) / Nobuyuki Tamura(Hosei Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability
Sub Title (in English)
Keyword(1)
1st Author's Name Akihiko Masuda
1st Author's Affiliation Reliability Seven Tools(R7) Practice Studio(R7 Studio)
2nd Author's Name Tateki Nishi
2nd Author's Affiliation DNV Business(DNV)
3rd Author's Name Hiroyuki Goto
3rd Author's Affiliation FDK Corporation(FDK)
4th Author's Name Ko Kawashima
4th Author's Affiliation Oriental motor Co. Ltd.(Oriental motor)
5th Author's Name Fumiaki Harada
5th Author's Affiliation Fuji Xerox Advanced Technology(FXAT)
Date 2016-07-29
Paper # R2016-17
Volume (vol) vol.116
Number (no) R-168
Page pp.pp.25-30(R),
#Pages 6
Date of Issue 2016-07-22 (R)