Presentation | 2016-07-15 A Durability Evaluation for Metallic-Foil Artifact-Metrics Naoki Yoshida, Tsutomu Matsumoto, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We proposed that metallic foils such as aluminum foils and gold foils can be applied to artifact-metrics, because the metallic-foil surfaces have enough individuality due their manufacturing process. However metallic-foils are weak against pressures. To mitigate the weakness we have suggested to cover the foils by permeability films. In this paper, we try to evaluate the durability of a type of metallic-foil artifact-metrics by measuring the accuracy of authentication for damaged artifact-metric objects. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Artifact-Metrics / Metallic-Foil / Laser scanning microscope / Security / Durability |
Paper # | ISEC2016-37,SITE2016-31,ICSS2016-37,EMM2016-45 |
Date of Issue | 2016-07-07 (ISEC, SITE, ICSS, EMM) |
Conference Information | |
Committee | EMM / ISEC / SITE / ICSS / IPSJ-CSEC / IPSJ-SPT |
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Conference Date | 2016/7/14(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | security, etc |
Chair | Akinori Ito(Tohoku Univ.) / Masahiro Mambo(Kanazawa Univ.) / Hitoshi Okada(NII) / Yutaka Miyake(KDDI R&D Labs.) |
Vice Chair | Masaki Kawamura(Yamaguchi Univ.) / Hirohisa Hioki(Kyoto Univ.) / Kazuto Ogawa(NHK) / Atsushi Fujioka(Kanagawa Univ.) / Tetsuya Morizumi(Kanagawa Univ.) / Masaru Ogawa(Kobe Gakuin Univ.) / Yoshiaki Shiraishi(Kobe Univ.) / Takeshi Ueda(Mitsubishi Electric) |
Secretary | Masaki Kawamura(Nagasaki Univ.) / Hirohisa Hioki(Osaka Pref. Univ.) / Kazuto Ogawa(Toshiba) / Atsushi Fujioka(Tohoku Univ.) / Tetsuya Morizumi(Kyushu Univ.) / Masaru Ogawa(Gifu Shotoku Gakuen Univ.) / Yoshiaki Shiraishi(NII) / Takeshi Ueda(Yokohama National Univ.) |
Assistant | Rui Shogenji(Shizuoka Univ.) / Masaaki Fujiyoshi(Tokyo Metropolitan Univ.) / Toshihiro Ohigashi(Tokai Univ.) / Yuuji Suga(IIJ) / Atsuo Inomata(Tokyo Denki Univ.) / Kanako Kawaguchi(Tokyo Univ. of the Arts) / Kazunori Kamiya(NTT) / Takahiro Kasama(NICT) |
Paper Information | |
Registration To | Technical Committee on Enriched MultiMedia / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Durability Evaluation for Metallic-Foil Artifact-Metrics |
Sub Title (in English) | |
Keyword(1) | Artifact-Metrics |
Keyword(2) | Metallic-Foil |
Keyword(3) | Laser scanning microscope |
Keyword(4) | Security |
Keyword(5) | Durability |
1st Author's Name | Naoki Yoshida |
1st Author's Affiliation | Yokohama National University(YNU) |
2nd Author's Name | Tsutomu Matsumoto |
2nd Author's Affiliation | Yokohama National University(YNU) |
Date | 2016-07-15 |
Paper # | ISEC2016-37,SITE2016-31,ICSS2016-37,EMM2016-45 |
Volume (vol) | vol.116 |
Number (no) | ISEC-129,SITE-130,ICSS-131,EMM-132 |
Page | pp.pp.229-236(ISEC), pp.229-236(SITE), pp.229-236(ICSS), pp.229-236(EMM), |
#Pages | 8 |
Date of Issue | 2016-07-07 (ISEC, SITE, ICSS, EMM) |