Presentation 2016-07-15
A Durability Evaluation for Metallic-Foil Artifact-Metrics
Naoki Yoshida, Tsutomu Matsumoto,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We proposed that metallic foils such as aluminum foils and gold foils can be applied to artifact-metrics, because the metallic-foil surfaces have enough individuality due their manufacturing process. However metallic-foils are weak against pressures. To mitigate the weakness we have suggested to cover the foils by permeability films. In this paper, we try to evaluate the durability of a type of metallic-foil artifact-metrics by measuring the accuracy of authentication for damaged artifact-metric objects.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Artifact-Metrics / Metallic-Foil / Laser scanning microscope / Security / Durability
Paper # ISEC2016-37,SITE2016-31,ICSS2016-37,EMM2016-45
Date of Issue 2016-07-07 (ISEC, SITE, ICSS, EMM)

Conference Information
Committee EMM / ISEC / SITE / ICSS / IPSJ-CSEC / IPSJ-SPT
Conference Date 2016/7/14(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English) security, etc
Chair Akinori Ito(Tohoku Univ.) / Masahiro Mambo(Kanazawa Univ.) / Hitoshi Okada(NII) / Yutaka Miyake(KDDI R&D Labs.)
Vice Chair Masaki Kawamura(Yamaguchi Univ.) / Hirohisa Hioki(Kyoto Univ.) / Kazuto Ogawa(NHK) / Atsushi Fujioka(Kanagawa Univ.) / Tetsuya Morizumi(Kanagawa Univ.) / Masaru Ogawa(Kobe Gakuin Univ.) / Yoshiaki Shiraishi(Kobe Univ.) / Takeshi Ueda(Mitsubishi Electric)
Secretary Masaki Kawamura(Nagasaki Univ.) / Hirohisa Hioki(Osaka Pref. Univ.) / Kazuto Ogawa(Toshiba) / Atsushi Fujioka(Tohoku Univ.) / Tetsuya Morizumi(Kyushu Univ.) / Masaru Ogawa(Gifu Shotoku Gakuen Univ.) / Yoshiaki Shiraishi(NII) / Takeshi Ueda(Yokohama National Univ.)
Assistant Rui Shogenji(Shizuoka Univ.) / Masaaki Fujiyoshi(Tokyo Metropolitan Univ.) / Toshihiro Ohigashi(Tokai Univ.) / Yuuji Suga(IIJ) / Atsuo Inomata(Tokyo Denki Univ.) / Kanako Kawaguchi(Tokyo Univ. of the Arts) / Kazunori Kamiya(NTT) / Takahiro Kasama(NICT)

Paper Information
Registration To Technical Committee on Enriched MultiMedia / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Durability Evaluation for Metallic-Foil Artifact-Metrics
Sub Title (in English)
Keyword(1) Artifact-Metrics
Keyword(2) Metallic-Foil
Keyword(3) Laser scanning microscope
Keyword(4) Security
Keyword(5) Durability
1st Author's Name Naoki Yoshida
1st Author's Affiliation Yokohama National University(YNU)
2nd Author's Name Tsutomu Matsumoto
2nd Author's Affiliation Yokohama National University(YNU)
Date 2016-07-15
Paper # ISEC2016-37,SITE2016-31,ICSS2016-37,EMM2016-45
Volume (vol) vol.116
Number (no) ISEC-129,SITE-130,ICSS-131,EMM-132
Page pp.pp.229-236(ISEC), pp.229-236(SITE), pp.229-236(ICSS), pp.229-236(EMM),
#Pages 8
Date of Issue 2016-07-07 (ISEC, SITE, ICSS, EMM)