| Presentation | 2016-07-15 Investigation Strategies and Relevance Metric on Dynamic Feature Location Maaki Nakano, Shinpei Hayashi, Takashi Kobayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In dynamic feature location based on formal concept analysis, it is a hard problem that modules implementing focused feature distribute dispersively among many formal concepts. For this reason, in locating, users must investigate many formal concepts. To improve the efficiency of this feature location technique, we propose two investigation strategies using a relevance metric. We use a similarity that is used in area of fault localization as a relevance metric. We applied our investigation strategies to several features of a representative open source software product and compared them with an existing strategy. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Dynamic Feature Location / Formal Concept Analysis |
| Paper # | SS2016-17,KBSE2016-23 |
| Date of Issue | 2016-07-06 (SS, KBSE) |
| Conference Information | |
| Committee | KBSE / SS / IPSJ-SE |
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| Conference Date | 2016/7/13(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Shigeo Kaneda(Doshisha Univ.) / Kazuhiro Ogata(JAIST) |
| Vice Chair | Fumihiro Kumeno(Nippon Inst. of Tech.) / Akio Nakata(Hiroshima City Univ.) |
| Secretary | Fumihiro Kumeno(Shinshu Univ.) / Akio Nakata(Nippon Inst. of Tech.) / (Tokyo Inst. of Tech.) |
| Assistant | Hajime Iwata(Kanagawa Inst. of Tech.) / Kohei Sakurai(Kanazawa Univ.) / Kazuyuki Shima(Hiroshima City Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Knowledge-Based Software Engineering / Technical Committee on Software Science / Special Interest Group on Software Engineering |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation Strategies and Relevance Metric on Dynamic Feature Location |
| Sub Title (in English) | |
| Keyword(1) | Dynamic Feature Location |
| Keyword(2) | Formal Concept Analysis |
| 1st Author's Name | Maaki Nakano |
| 1st Author's Affiliation | Tokyo Insitute of Technology(Tokyo Tech.) |
| 2nd Author's Name | Shinpei Hayashi |
| 2nd Author's Affiliation | Tokyo Insitute of Technology(Tokyo Tech.) |
| 3rd Author's Name | Takashi Kobayashi |
| 3rd Author's Affiliation | Tokyo Insitute of Technology(Tokyo Tech.) |
| Date | 2016-07-15 |
| Paper # | SS2016-17,KBSE2016-23 |
| Volume (vol) | vol.116 |
| Number (no) | SS-127,KBSE-128 |
| Page | pp.pp.169-174(SS), pp.169-174(KBSE), |
| #Pages | 6 |
| Date of Issue | 2016-07-06 (SS, KBSE) |