| Presentation | 2016-06-16 On random test pattern generation algorithm considering signal transition activities Yusuke Matsunaga, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a test pattern generation method with considering signal transition activities using Markov chain Monte-Carlo method. Experimental results show that the number of detected faults using the proposed method is compatible to the existing method which does not consider signal transition activities, however, the number patterns is likely to increase. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test pattern generation / signal transition activity / Markov chain Monte-Carlo algorithm |
| Paper # | CAS2016-4,VLD2016-10,SIP2016-38,MSS2016-4 |
| Date of Issue | 2016-06-09 (CAS, VLD, SIP, MSS) |
| Conference Information | |
| Committee | VLD / CAS / MSS / SIP |
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| Conference Date | 2016/6/16(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hirosaki Shiritsu Kanko-kan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | System, signal processing and related topics |
| Chair | Takashi Takenana(NEC) / Toshihiko Takahashi(Niigata Univ.) / Satoshi Yamane(Kanazawa Univ.) / Makoto Nakashizuka(Chiba Inst. of Tech.) |
| Vice Chair | Hiroyuki Ochi(Ritsumeikan Univ.) / Mitsuru Hiraki(Renesas) / Morikazu Nakamura(Univ. of Ryukyus) / Masahiro Okuda(Univ. of Kitakyushu) / Shogo Muramatsu(Niigata Univ.) |
| Secretary | Hiroyuki Ochi(Fujitsu Labs.) / Mitsuru Hiraki(Hiroshima City Univ.) / Morikazu Nakamura(Tohoku Univ.) / Masahiro Okuda(Renesas) / Shogo Muramatsu(Yamaguchi Univ.) |
| Assistant | Parizy Matthieu(Fujitsu Labs.) / Toshihiro Tachibana(Shonan Inst. of Tech.) / Yohei Nakamura(Hitachi) / Hideki Kinjo(Okinawa Univ.) / Osamu Watanabe(Takushoku Univ.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Circuits and Systems / Technical Committee on Mathematical Systems Science and its applications / Technical Committee on Signal Processing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On random test pattern generation algorithm considering signal transition activities |
| Sub Title (in English) | |
| Keyword(1) | test pattern generation |
| Keyword(2) | signal transition activity |
| Keyword(3) | Markov chain Monte-Carlo algorithm |
| 1st Author's Name | Yusuke Matsunaga |
| 1st Author's Affiliation | Kyushu University(Kyushu Univ.) |
| Date | 2016-06-16 |
| Paper # | CAS2016-4,VLD2016-10,SIP2016-38,MSS2016-4 |
| Volume (vol) | vol.116 |
| Number (no) | CAS-93,VLD-94,SIP-95,MSS-96 |
| Page | pp.pp.19-22(CAS), pp.19-22(VLD), pp.19-22(SIP), pp.19-22(MSS), |
| #Pages | 4 |
| Date of Issue | 2016-06-09 (CAS, VLD, SIP, MSS) |