Presentation 2016-06-03
A study on system characterization of an optical E-field probe
Takehiro Morioka, Satoru Kurokawa, Jun Ichijou, Yoshikazu Toba,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EMCJ2016-38
Date of Issue 2016-05-26 (EMCJ)

Conference Information
Committee EMCJ / IEE-EMC / IEE-MAG
Conference Date 2016/6/2(2days)
Place (in Japanese) (See Japanese page)
Place (in English) NTU, Taiwan
Topics (in Japanese) (See Japanese page)
Topics (in English) EMC Joint Workshop, 2016, Taipei
Chair Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Masahiro Yamaguchi(Tohoku Univ.)
Vice Chair Osami Wada(Kyoto Univ.)
Secretary Osami Wada(AIST) / (Hitachi Automotive Systems) / (Osaka Univ.)
Assistant Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Keiju Yamada(Toshiba Co.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Meeting on Magnetics
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A study on system characterization of an optical E-field probe
Sub Title (in English)
Keyword(1)
1st Author's Name Takehiro Morioka
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
2nd Author's Name Satoru Kurokawa
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
3rd Author's Name Jun Ichijou
3rd Author's Affiliation SEIKOH GIKEN Co.,Ltd.(SEIKOH GIKEN)
4th Author's Name Yoshikazu Toba
4th Author's Affiliation SEIKOH GIKEN Co.,Ltd.(SEIKOH GIKEN)
Date 2016-06-03
Paper # EMCJ2016-38
Volume (vol) vol.116
Number (no) EMCJ-72
Page pp.pp.73-73(EMCJ),
#Pages 1
Date of Issue 2016-05-26 (EMCJ)