Presentation 2016-06-17
A Study on Fault Tolerant Features of Asynchronous Circuits using Voted-enable Latches
Masashi Imai, Tomohiro Yoneda,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A bit flip caused by voltage fluctuation, soft errors, and hardware Trojans becomes one of serious issues in the modern computer systems. In latch-based asynchronous circuits, it is relatively difficult to tolerate a bit flip since its enable signal is usually implemented using a single-wire, whose capacitance is small. In this paper, one idea to tolerate the bit flip in the latch-based asynchronous circuits is proposed. A new voted-enable D-latch circuitry is presented and its evaluation results are shown using the 130nm process technology.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Soft error / Hardware Trojan / Asynchronous circuits / Latch-based circuits / 2-phase handshaking protocol
Paper # CAS2016-33,VLD2016-39,SIP2016-67,MSS2016-33
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS)

Conference Information
Committee VLD / CAS / MSS / SIP
Conference Date 2016/6/16(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Hirosaki Shiritsu Kanko-kan
Topics (in Japanese) (See Japanese page)
Topics (in English) System, signal processing and related topics
Chair Takashi Takenana(NEC) / Toshihiko Takahashi(Niigata Univ.) / Satoshi Yamane(Kanazawa Univ.) / Makoto Nakashizuka(Chiba Inst. of Tech.)
Vice Chair Hiroyuki Ochi(Ritsumeikan Univ.) / Mitsuru Hiraki(Renesas) / Morikazu Nakamura(Univ. of Ryukyus) / Masahiro Okuda(Univ. of Kitakyushu) / Shogo Muramatsu(Niigata Univ.)
Secretary Hiroyuki Ochi(Fujitsu Labs.) / Mitsuru Hiraki(Hiroshima City Univ.) / Morikazu Nakamura(Tohoku Univ.) / Masahiro Okuda(Renesas) / Shogo Muramatsu(Yamaguchi Univ.)
Assistant Parizy Matthieu(Fujitsu Labs.) / Toshihiro Tachibana(Shonan Inst. of Tech.) / Yohei Nakamura(Hitachi) / Hideki Kinjo(Okinawa Univ.) / Osamu Watanabe(Takushoku Univ.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Circuits and Systems / Technical Committee on Mathematical Systems Science and its applications / Technical Committee on Signal Processing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Fault Tolerant Features of Asynchronous Circuits using Voted-enable Latches
Sub Title (in English)
Keyword(1) Soft error
Keyword(2) Hardware Trojan
Keyword(3) Asynchronous circuits
Keyword(4) Latch-based circuits
Keyword(5) 2-phase handshaking protocol
1st Author's Name Masashi Imai
1st Author's Affiliation Hirosaki University(Hirosaki Univ.)
2nd Author's Name Tomohiro Yoneda
2nd Author's Affiliation National Institute of Informatics(NII)
Date 2016-06-17
Paper # CAS2016-33,VLD2016-39,SIP2016-67,MSS2016-33
Volume (vol) vol.116
Number (no) CAS-93,VLD-94,SIP-95,MSS-96
Page pp.pp.179-184(CAS), pp.179-184(VLD), pp.179-184(SIP), pp.179-184(MSS),
#Pages 6
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS)