Presentation 2016-06-17
Thermal Analysis in 3D ICs
Kaoru Furumi, Masashi Imai, Nanako Niioka, Atsushi Kurokawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Three-dimensional integrated circuits (3D ICs) lead to higher power densities than 2D ICs because of the stacking of multiple device layers. Thermal issue is one of the critical challenges in the field of 3D ICs. Since temperature affects signal delay and chip reliability, it is very important to clarify the impacts of various parameters on the maximum temperature in a 3D IC. In this report, we present several useful results obtained by thermal analysis with varying physical and material parameters of through-silicon-via (TSV) based 3D ICs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Thermal Analysis / 3D IC / Through Silicon Vias (TSVs) / Heat Sink
Paper # CAS2016-32,VLD2016-38,SIP2016-66,MSS2016-32
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS)

Conference Information
Committee VLD / CAS / MSS / SIP
Conference Date 2016/6/16(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Hirosaki Shiritsu Kanko-kan
Topics (in Japanese) (See Japanese page)
Topics (in English) System, signal processing and related topics
Chair Takashi Takenana(NEC) / Toshihiko Takahashi(Niigata Univ.) / Satoshi Yamane(Kanazawa Univ.) / Makoto Nakashizuka(Chiba Inst. of Tech.)
Vice Chair Hiroyuki Ochi(Ritsumeikan Univ.) / Mitsuru Hiraki(Renesas) / Morikazu Nakamura(Univ. of Ryukyus) / Masahiro Okuda(Univ. of Kitakyushu) / Shogo Muramatsu(Niigata Univ.)
Secretary Hiroyuki Ochi(Fujitsu Labs.) / Mitsuru Hiraki(Hiroshima City Univ.) / Morikazu Nakamura(Tohoku Univ.) / Masahiro Okuda(Renesas) / Shogo Muramatsu(Yamaguchi Univ.)
Assistant Parizy Matthieu(Fujitsu Labs.) / Toshihiro Tachibana(Shonan Inst. of Tech.) / Yohei Nakamura(Hitachi) / Hideki Kinjo(Okinawa Univ.) / Osamu Watanabe(Takushoku Univ.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Circuits and Systems / Technical Committee on Mathematical Systems Science and its applications / Technical Committee on Signal Processing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Thermal Analysis in 3D ICs
Sub Title (in English)
Keyword(1) Thermal Analysis
Keyword(2) 3D IC
Keyword(3) Through Silicon Vias (TSVs)
Keyword(4) Heat Sink
1st Author's Name Kaoru Furumi
1st Author's Affiliation Hirosaki University(Hirosaki Univ.)
2nd Author's Name Masashi Imai
2nd Author's Affiliation Hirosaki University(Hirosaki Univ.)
3rd Author's Name Nanako Niioka
3rd Author's Affiliation Hirosaki University(Hirosaki Univ.)
4th Author's Name Atsushi Kurokawa
4th Author's Affiliation Hirosaki University(Hirosaki Univ.)
Date 2016-06-17
Paper # CAS2016-32,VLD2016-38,SIP2016-66,MSS2016-32
Volume (vol) vol.116
Number (no) CAS-93,VLD-94,SIP-95,MSS-96
Page pp.pp.173-178(CAS), pp.173-178(VLD), pp.173-178(SIP), pp.173-178(MSS),
#Pages 6
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS)