| Presentation | 2016-06-20 A Binding Method for Testability to Generate Easily Testable Functional Time Expansion Models Mamoru Sato, Toshinori hosokawa, Tetsuya Masuda, Jun Nishimaki, Hideo Fujiwara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A test generation method for datapaths using easily testable functional time expansion models was proposed as efficient algorithms. In the test generation method, several easily testable time expansion models are generated for datapaths and test sequences are generated using the models. Moreover, controller augmentation is performed to make the behavior of easily testable functional time expansion models controllable. However, if circuit structures of datapaths are not easily testable, it is hard to generate easily testable functional time expansion models with small numbers of time expansion by controller augmentation. In this paper, sequential depths for inputs and an output for operational units are proposed as testability measures for circuit structures of datapaths and a binding method for testability to reduce the sequential depths is proposed. Experimental results for benchmark circuits show that the proposed binding method is effective for sequential depths of operational units, fault coverage, and test generation time, compared to conventional binding methods without testability consideration. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | high-level synthesis / test generation / easily testable functional time expansion models / sequential depths of inputs and an output for operational units / binding |
| Paper # | DC2016-14 |
| Date of Issue | 2016-06-13 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2016/6/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification, etc. |
| Chair | Michiko Inoue(NAIST) |
| Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Binding Method for Testability to Generate Easily Testable Functional Time Expansion Models |
| Sub Title (in English) | |
| Keyword(1) | high-level synthesis |
| Keyword(2) | test generation |
| Keyword(3) | easily testable functional time expansion models |
| Keyword(4) | sequential depths of inputs and an output for operational units |
| Keyword(5) | binding |
| 1st Author's Name | Mamoru Sato |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Toshinori hosokawa |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Tetsuya Masuda |
| 3rd Author's Affiliation | Nihon University(Nihon Univ.) |
| 4th Author's Name | Jun Nishimaki |
| 4th Author's Affiliation | Nihon University(Nihon Univ.) |
| 5th Author's Name | Hideo Fujiwara |
| 5th Author's Affiliation | Osaka Gakuin Univ.(Osaka Gakuin Univ.) |
| Date | 2016-06-20 |
| Paper # | DC2016-14 |
| Volume (vol) | vol.116 |
| Number (no) | DC-108 |
| Page | pp.pp.25-30(DC), |
| #Pages | 6 |
| Date of Issue | 2016-06-13 (DC) |