| Presentation | 2016-06-02 [Poster Presentation] Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI Takuya Itoh, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal waves has a difficulty in injecting faults at a specific operation or time. Therefore, it is not fully considered that an analytical methods for this fault injection method. In this paper, we propose a suitable analytical method for IEMI based fault injection method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Fault analysis / Intentional electromagnetic interference / FSA |
| Paper # | EMCJ2016-43 |
| Date of Issue | 2016-05-26 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / IEE-EMC / IEE-MAG |
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| Conference Date | 2016/6/2(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | NTU, Taiwan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | EMC Joint Workshop, 2016, Taipei |
| Chair | Hideaki Sone(Tohoku Univ.) / Ken Kawamata(Tohoku-gakuin Univ.) / Masahiro Yamaguchi(Tohoku Univ.) |
| Vice Chair | Osami Wada(Kyoto Univ.) |
| Secretary | Osami Wada(AIST) / (Hitachi Automotive Systems) / (Osaka Univ.) |
| Assistant | Yoshiki Kayano(Univ. of Electro-Comm.) / Yusaku Katsube(Hitachi) / Chie Sasaki(Panasonic) / Yu-ichi Hayashi(Tohoku-gakuin Univ.) / Keiju Yamada(Toshiba Co.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility / Technical Meeting on Magnetics |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Poster Presentation] Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI |
| Sub Title (in English) | |
| Keyword(1) | Fault analysis |
| Keyword(2) | Intentional electromagnetic interference |
| Keyword(3) | FSA |
| 1st Author's Name | Takuya Itoh |
| 1st Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 2nd Author's Name | Yu-ichi Hayashi |
| 2nd Author's Affiliation | Tohoku Gakuin University(Tohoku Gakuin Univ.) |
| 3rd Author's Name | Takaaki Mizuki |
| 3rd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 4th Author's Name | Hideaki Sone |
| 4th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| Date | 2016-06-02 |
| Paper # | EMCJ2016-43 |
| Volume (vol) | vol.116 |
| Number (no) | EMCJ-72 |
| Page | pp.pp.83-84(EMCJ), |
| #Pages | 2 |
| Date of Issue | 2016-05-26 (EMCJ) |