Presentation 2016-06-14
Arc point selection and arc point integration for efficient ellipse detection
Tomonari Masuzaki, Yasuyuki Sugaya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We propose a new method to select elliptic point sequences from an image for detecting ellipses. The basic ellipse detecting method are Hough transform and RANSAC. However these methods need a lot of iterative calculation. And if the loss of point sequences are large, these methods can not fit correct ellipses. For these problems, Sugaya et al. proposed a method to re-fit correct ellipses by model selection based integration of point sequences. Because this method uses RANSAC, its method needs a lot of computation. In this study, we improve the selection of elliptic arc point sequences and the integration of point sequences of the method of Sugaya et al. We achieves a more efficient ellipse detection that does not use a random sampling.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) model selection / MDL / ellipse fitting / ellipse detection
Paper # PRMU2016-53,SP2016-19,WIT2016-19
Date of Issue 2016-06-06 (PRMU, SP, WIT)

Conference Information
Committee PRMU / SP / WIT / ASJ-H
Conference Date 2016/6/13(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Eisaku Maeda(NTT) / Kazunori Mano(Shibaura Inst. of Tech.) / Kiyohiko Nunokawa(Tokyo International Univ.)
Vice Chair Seiichi Uchida(Kyushu Univ.) / Hironobu Fujiyoshi(Chubu Univ.) / Hiroki Mori(Utsunomiya Univ.) / Chikamune Wada(Kyushu Inst. of Tech.)
Secretary Seiichi Uchida(Kyoto Univ.) / Hironobu Fujiyoshi(NTT) / Hiroki Mori(Kobe Univ.) / Chikamune Wada(Shizuoka Univ.) / (Nagoya Inst. of Tech.)
Assistant Masaki Oonishi(AIST) / Takuya Funatomi(NAIST) / Taichi Asami(NTT) / Kei Hashimoto(Nagoya Inst. of Tech.) / Tomohiro Amemiya(NTT) / Takeaki Shionome(Tsukuba Univ. of Tech.) / Manabi Miyagi(Tsukuba Univ. of Tech.)

Paper Information
Registration To Technical Committee on Pattern Recognition and Media Understanding / Technical Committee on Speech / Technical Committee on Well-being Information Technology / Auditory Research Meeting
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Arc point selection and arc point integration for efficient ellipse detection
Sub Title (in English)
Keyword(1) model selection
Keyword(2) MDL
Keyword(3) ellipse fitting
Keyword(4) ellipse detection
1st Author's Name Tomonari Masuzaki
1st Author's Affiliation Toyohashi University of Technology(TUT)
2nd Author's Name Yasuyuki Sugaya
2nd Author's Affiliation Toyohashi University of Technology(TUT)
Date 2016-06-14
Paper # PRMU2016-53,SP2016-19,WIT2016-19
Volume (vol) vol.116
Number (no) PRMU-89,SP-90,WIT-91
Page pp.pp.105-110(PRMU), pp.105-110(SP), pp.105-110(WIT),
#Pages 6
Date of Issue 2016-06-06 (PRMU, SP, WIT)