| Presentation | 2016-05-11 Multi bit soft error tolerant FPGA architecture Yuji Nakamura, Takuya Teraoka, Motoki Amagasaki, Masahiro Iida, Morihiro Kuga, Toshinori Sueyoshi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Due to reaching the nanoscale transistor size, effect of soft error to the memory has become conspicuous. In small device geometries, a single particle strike might affect multiple adjacent cells in a memory array resulting in a MBU (Multiple Bit Upset). Traditional fault tolerance technologies such as TMR (Triple Modular Redundancy) and ECC (Error Correcting Code) occupy the large area and have vulnerability to MBU. In this research, we propose DMR (Double Modular Redundancy) based error correct circuit and employ a combination of proposed circuit and the interleaving technique to mitigate MBU. In addition, we explain soft error simulator developed to calculate bit interleaving distance. The results show that the area of proposed circuit is the smallest when we compare the proposed circuit, ECC based error correct circuit and TMR. Simulation results show that the interleaving distance which can conceal all MBU patterns is 4. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Soft error / MBU / Bit interleaving technique |
| Paper # | VLD2016-3 |
| Date of Issue | 2016-05-04 (VLD) |
| Conference Information | |
| Committee | VLD / IPSJ-SLDM |
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| Conference Date | 2016/5/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kitakyushu International Conference Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | System Design, etc. |
| Chair | Yusuke Matsunaga(Kyushu Univ.) / Masahiro Fukui(Ritsumeikan Univ.) |
| Vice Chair | Takashi Takenana(NEC) |
| Secretary | Takashi Takenana(Ritsumeikan Univ.) / (Fujitsu Labs.) |
| Assistant | Ittetsu Taniguchi(Ritsumeikan Univ.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Special Interest Group on System and LSI Design Methodology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Multi bit soft error tolerant FPGA architecture |
| Sub Title (in English) | |
| Keyword(1) | Soft error |
| Keyword(2) | MBU |
| Keyword(3) | Bit interleaving technique |
| 1st Author's Name | Yuji Nakamura |
| 1st Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| 2nd Author's Name | Takuya Teraoka |
| 2nd Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| 3rd Author's Name | Motoki Amagasaki |
| 3rd Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| 4th Author's Name | Masahiro Iida |
| 4th Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| 5th Author's Name | Morihiro Kuga |
| 5th Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| 6th Author's Name | Toshinori Sueyoshi |
| 6th Author's Affiliation | Kumamoto University(Kumamoto Univ.) |
| Date | 2016-05-11 |
| Paper # | VLD2016-3 |
| Volume (vol) | vol.116 |
| Number (no) | VLD-21 |
| Page | pp.pp.35-40(VLD), |
| #Pages | 6 |
| Date of Issue | 2016-05-04 (VLD) |