| Presentation | 2016-04-21 Development of Electromagnetic Emission Test Method Achieving Noise Source Discrimination by Near-Field Probing with Optical Electric-field Sensor Michitaka Ameya, Satoru Kurokawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
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| Conference Information | |
| Committee | MWP |
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| Conference Date | 2016/4/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Teraherz, etc. |
| Chair | Yuichi Kado(Kyoto Inst. of Tech.) |
| Vice Chair | Tetsuya Kawanishi(NICT) / Hiroyuki Toda(Doshisha Univ.) |
| Secretary | Tetsuya Kawanishi(ENRI) / Hiroyuki Toda(NTT) |
| Assistant | Kensuke Ikeda(CRIEPI) / Atsushi Kanno(NICT) |
| Paper Information | |
| Registration To | Technical Committee on Microwave and Millimeter-wave Photonics |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Development of Electromagnetic Emission Test Method Achieving Noise Source Discrimination by Near-Field Probing with Optical Electric-field Sensor |
| Sub Title (in English) | |
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| 1st Author's Name | Michitaka Ameya |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| 2nd Author's Name | Satoru Kurokawa |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
| Date | 2016-04-21 |
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| Volume (vol) | vol.116 |
| Number (no) | MWP-15 |
| Page | pp.pp.-(), |
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