Presentation 2016-04-08
Electrical Characterization of Germanium films Crystallized by Atmospheric Pressure Micro-Thermal-Plasma-Jet Irradiation and Fabrication of High-Performance Thin Film Transistors.
Taichi Nakatani, Hiromu Harada, Seiichiro Higashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We investigated the electrical properties of the crystalline germanium films crystallized by μ-TPJ irradiation. High speed lateral crystallization (HSLC-) Ge shows low hole concentration (1.5 x 10^16 cm^-3) and high hall mobility (1070 cm^2/Vs). P-type thin film transistors (TFT) using HSLC-Ge and SiO2 film as the gate dielectric achieved field effect mobility (μFE) of 196 cm^2/Vs and ON/OFF ratio (RON/OFF) of 1.4 x 10^4.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Micro-Thermal-Plasma-Jet / Germanium / Thin Film Transistor
Paper # SDM2016-9,OME2016-9
Date of Issue 2016-04-01 (SDM, OME)

Conference Information
Committee SDM / OME
Conference Date 2016/4/8(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Okinawa Prefectural Museum & Art Museum
Topics (in Japanese) (See Japanese page)
Topics (in English) Thin film devices, etc
Chair Yuzou Oono(Univ. of Tsukuba) / Naoki Matsuda(AIST)
Vice Chair Tatsuya Kunikiyo(Renesas) / Tatsuo Mori(Aichi Inst. of Tech.)
Secretary Tatsuya Kunikiyo(Tohoku Univ.) / Tatsuo Mori(NTT)
Assistant Tadashi Yamaguchi(Renesas) / Hirotake Kajii(Osaka Univ.) / Dai Taguchi(Tokyo Inst. of Tech.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials / Technical Committee on Organic Molecular Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electrical Characterization of Germanium films Crystallized by Atmospheric Pressure Micro-Thermal-Plasma-Jet Irradiation and Fabrication of High-Performance Thin Film Transistors.
Sub Title (in English)
Keyword(1) Micro-Thermal-Plasma-Jet
Keyword(2) Germanium
Keyword(3) Thin Film Transistor
1st Author's Name Taichi Nakatani
1st Author's Affiliation Hiroshima University(Hiroshima Univ.)
2nd Author's Name Hiromu Harada
2nd Author's Affiliation Hiroshima University(Hiroshima Univ.)
3rd Author's Name Seiichiro Higashi
3rd Author's Affiliation Hiroshima University(Hiroshima Univ.)
Date 2016-04-08
Paper # SDM2016-9,OME2016-9
Volume (vol) vol.116
Number (no) SDM-1,OME-2
Page pp.pp.35-38(SDM), pp.35-38(OME),
#Pages 4
Date of Issue 2016-04-01 (SDM, OME)