| Presentation | 2016-04-14 [Invited Lecture] Reliability Projecting for ReRAM based on Stochastic Differential Equation Zhiqiang Wei, Koji Eriguchi, Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An analytic formula based on stochastic differential equation is successfully developed to describe intrinsic ReRAM variation. The formula is useful to predict scaled ReRAM memory window after retention, verified by testing 40 nm 2Mb memory array. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Stochastic Differential EquationPercolation hopping modelFilamentRetention |
| Paper # | ICD2016-7 |
| Date of Issue | 2016-04-07 (ICD) |
| Conference Information | |
| Committee | ICD |
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| Conference Date | 2016/4/14(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Minoru Fujishima(Hiroshima Univ.) |
| Vice Chair | Hideto Hidaka(Renesas) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) |
| Assistant | Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] Reliability Projecting for ReRAM based on Stochastic Differential Equation |
| Sub Title (in English) | |
| Keyword(1) | Stochastic Differential EquationPercolation hopping modelFilamentRetention |
| 1st Author's Name | Zhiqiang Wei |
| 1st Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 2nd Author's Name | Koji Eriguchi |
| 2nd Author's Affiliation | Kyoto Univerisity(Kyoto Univ.) |
| 3rd Author's Name | Shunsaku Muraoka |
| 3rd Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 4th Author's Name | Koji Katayama |
| 4th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 5th Author's Name | Ryotaro Yasuhara |
| 5th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 6th Author's Name | Kawai Ken |
| 6th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 7th Author's Name | Yukio Hayakawa |
| 7th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 8th Author's Name | Kazuhiko Shimakawa |
| 8th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 9th Author's Name | Takumi Mikawa |
| 9th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| 10th Author's Name | Yoneda Shinichi |
| 10th Author's Affiliation | 1Panasonic Semiconductor Solutions Co., Ltd.,(PSCS) |
| Date | 2016-04-14 |
| Paper # | ICD2016-7 |
| Volume (vol) | vol.116 |
| Number (no) | ICD-3 |
| Page | pp.pp.33-37(ICD), |
| #Pages | 5 |
| Date of Issue | 2016-04-07 (ICD) |