Presentation 2016-03-11
EM leakage from a rectangular hole in a thick conducting screen
Hirohide Serizawa, Souichirou Suzuki, Shinichi Hirao,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The transmission coefficients of rectangular apertures less than the half-wavelength are calculated for various aperture sizes, aspect ratios, and screen's thicknesses by using the exact solution of the plane wave diffraction by a rectangular hole in a thick conducting screen based on the method of the Kobayashi potential (KP), and the results are compared with those of the corresponding acoustic diffraction problem. We also visualize the power flow near the aperture for which all waveguide modes become evanescent waves by means of the 2D vector plot and the states of leaky waves are observed for various screen's thicknesses and aperture aspect ratios.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Kobayashi potential / rectangular hole / thick conducting screen / exact solution / power flow / leakage
Paper # EMCJ2015-126
Date of Issue 2016-03-04 (EMCJ)

Conference Information
Committee EMCJ
Conference Date 2016/3/11(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) EMC
Chair Hideaki Sone(Tohoku Univ.)
Vice Chair Osami Wada(Kyoto Univ.)
Secretary Osami Wada(Okayama Univ.)
Assistant Atsuhiro Takahashi(Toyota Central R&D Labs.) / Yoshiki Kayano(Akita Univ.) / Yusaku Katsube(Hitachi)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility
Language ENG-JTITLE
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) EM leakage from a rectangular hole in a thick conducting screen
Sub Title (in English) Calculation of the power flow near the aperture
Keyword(1) Kobayashi potential
Keyword(2) rectangular hole
Keyword(3) thick conducting screen
Keyword(4) exact solution
Keyword(5) power flow
Keyword(6) leakage
1st Author's Name Hirohide Serizawa
1st Author's Affiliation National Institute of Technology, Numazu College(NIT, Numazu College)
2nd Author's Name Souichirou Suzuki
2nd Author's Affiliation National Institute of Technology, Numazu College(NIT, Numazu College)
3rd Author's Name Shinichi Hirao
3rd Author's Affiliation National Institute of Technology, Numazu College(NIT, Numazu College)
Date 2016-03-11
Paper # EMCJ2015-126
Volume (vol) vol.115
Number (no) EMCJ-509
Page pp.pp.11-16(EMCJ),
#Pages 6
Date of Issue 2016-03-04 (EMCJ)