| Presentation | 2016-03-25 A consideration on variation correction for fail prediction in LSI test Ryo Ogawa, Yoshiyuki Nakamura, Michiko Inoue, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, a test cost reduction using data mining has been attracted. It is expected to reduce the cost by predicting failing LSIs in later test processes using result of earlier test processes. However measured values in test processes have variation caused by the manufacturing and measurements themselves. Therefore, it is difficult to predict tests results without correction. In this paper, we propose variation correction method that corrects variations among package-lots, testers, and tester-sites respectively. We also propose a method to evaluate the effectiveness of correction and show that the proposed correction method is effective. Finally, we will consider how the proposed correction method is effective to fail prediction during LSI testing. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | data mining / burn-in test / LSI test / variation correction / outlier analysis |
| Paper # | CPSY2015-158,DC2015-112 |
| Date of Issue | 2016-03-17 (CPSY, DC) |
| Conference Information | |
| Committee | CPSY / DC / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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| Conference Date | 2016/3/24(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Fukue Bunka Hall/Rodou Fukushi Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | ETNET2016 |
| Chair | Yasuhiko Nakashima(NAIST) / Nobuyasu Kanekawa(Hitachi) / Masahiro Fukui(Ritsumeikan Univ.) |
| Vice Chair | Koji Nakano(Hiroshima Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Michiko Inoue(NAIST) |
| Secretary | Koji Nakano(Fujitsu Labs.) / Hidetsugu Irie(NII) / Michiko Inoue(RTRI) / (Kyoto Sangyo Univ.) / (Sharp) / (Kitakyushu City Univ.) |
| Assistant | Shinya Takameda(NAIST) / Takeshi Ohkawa(Utsunomiya Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Computer Systems / Technical Committee on Dependable Computing / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A consideration on variation correction for fail prediction in LSI test |
| Sub Title (in English) | |
| Keyword(1) | data mining |
| Keyword(2) | burn-in test |
| Keyword(3) | LSI test |
| Keyword(4) | variation correction |
| Keyword(5) | outlier analysis |
| 1st Author's Name | Ryo Ogawa |
| 1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 2nd Author's Name | Yoshiyuki Nakamura |
| 2nd Author's Affiliation | Renesas Semiconductor Package & Test Solutions(Renesas Semiconductor Package & Test Solutions) |
| 3rd Author's Name | Michiko Inoue |
| 3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2016-03-25 |
| Paper # | CPSY2015-158,DC2015-112 |
| Volume (vol) | vol.115 |
| Number (no) | CPSY-518,DC-519 |
| Page | pp.pp.271-276(CPSY), pp.271-276(DC), |
| #Pages | 6 |
| Date of Issue | 2016-03-17 (CPSY, DC) |