| Presentation | 2016-04-15 [Invited Talk] A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C Satoru Nakanishi, Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Kurafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A first-ever 90nm embedded 1T-MONOS Flash macro is presented to realize automotive reliability and simple process integration. Read Disturb Free Array Architecture fully solves conventional read disturb issue in 1T-MONOS for automotive use. Adaptable Slope Pulse Control (ASPC) technique can achieve endurance over 100M cycles at Tj = 175°C and P/E current of only 98uA. Idling P/E Management Unit (IPEMU) scheme can reduce power consumption in Automotive Analog system by 99%. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | for Automotive / embedded Flash memory / high P/E endurance / low power consumption / 1T-MONOS |
| Paper # | ICD2016-15 |
| Date of Issue | 2016-04-07 (ICD) |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2016/4/14(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Minoru Fujishima(Hiroshima Univ.) |
| Vice Chair | Hideto Hidaka(Renesas) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) |
| Assistant | Makoto Takamiya(Univ. of Tokyo) / Hiroe Iwasaki(NTT) / Takashi Hashimoto(Panasonic) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Talk] A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C |
| Sub Title (in English) | |
| Keyword(1) | for Automotive |
| Keyword(2) | embedded Flash memory |
| Keyword(3) | high P/E endurance |
| Keyword(4) | low power consumption |
| Keyword(5) | 1T-MONOS |
| 1st Author's Name | Satoru Nakanishi |
| 1st Author's Affiliation | Renesas Electronics(Renesas) |
| 2nd Author's Name | Hidenori Mitani |
| 2nd Author's Affiliation | Renesas Electronics(Renesas) |
| 3rd Author's Name | Ken Matsubara |
| 3rd Author's Affiliation | Renesas Electronics(Renesas) |
| 4th Author's Name | Hiroshi Yoshida |
| 4th Author's Affiliation | Renesas Electronics(Renesas) |
| 5th Author's Name | Takashi Kono |
| 5th Author's Affiliation | Renesas Electronics(Renesas) |
| 6th Author's Name | Yasuhiko Taito |
| 6th Author's Affiliation | Renesas Electronics(Renesas) |
| 7th Author's Name | Takashi Ito |
| 7th Author's Affiliation | Renesas Electronics(Renesas) |
| 8th Author's Name | Takashi Kurafuji |
| 8th Author's Affiliation | Renesas Electronics(Renesas) |
| 9th Author's Name | Kenji Noguchi |
| 9th Author's Affiliation | Renesas Electronics(Renesas) |
| 10th Author's Name | Hideto Hidaka |
| 10th Author's Affiliation | Renesas Electronics(Renesas) |
| 11th Author's Name | Tadaaki Yamauchi |
| 11th Author's Affiliation | Renesas Electronics(Renesas) |
| Date | 2016-04-15 |
| Paper # | ICD2016-15 |
| Volume (vol) | vol.116 |
| Number (no) | ICD-3 |
| Page | pp.pp.77-81(ICD), |
| #Pages | 5 |
| Date of Issue | 2016-04-07 (ICD) |